Robustness of Voltage-induced Magnetocapacitance

Hideo Kaiju, Takahiro Misawa, Taro Nagahama, Takashi Komine, Osamu Kitakami, Masaya Fujioka, Junji Nishii, Gang Xiao

Research output: Contribution to journalArticle

Abstract

One of the most important achievements in the field of spintronics is the development of magnetic tunnel junctions (MTJs). MTJs exhibit a large tunneling magnetoresistance (TMR). However, TMR is strongly dependent on biasing voltage, generally, decreasing with applying bias. The rapid decay of TMR was a major deficiency of MTJs. Here we report a new phenomenon at room temperature, in which the tunneling magnetocapacitance (TMC) increases with biasing voltage in an MTJ system based on Co 40 Fe 40 B 20 /MgO/Co 40 Fe 40 B 20 . We have observed a maximum TMC value of 102% under appropriate biasing, which is the largest voltage-induced TMC effect ever reported for MTJs. We have found excellent agreement between theory and experiment for the bipolar biasing regions using Debye-Fröhlich model combined with quartic barrier approximation and spin-dependent drift-diffusion model. Based on our calculation, we predict that the voltage-induced TMC ratio could reach 1100% in MTJs with a corresponding TMR value of 604%. Our work has provided a new understanding on the voltage-induced AC spin-dependent transport in MTJs. The results reported here may open a novel pathway for spintronics applications, e.g., non-volatile memories and spin logic circuits.

Original languageEnglish
Article number14709
JournalScientific reports
Volume8
Issue number1
DOIs
Publication statusPublished - 2018 Dec 1
Externally publishedYes

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Kaiju, H., Misawa, T., Nagahama, T., Komine, T., Kitakami, O., Fujioka, M., ... Xiao, G. (2018). Robustness of Voltage-induced Magnetocapacitance. Scientific reports, 8(1), [14709]. https://doi.org/10.1038/s41598-018-33065-y

Robustness of Voltage-induced Magnetocapacitance. / Kaiju, Hideo; Misawa, Takahiro; Nagahama, Taro; Komine, Takashi; Kitakami, Osamu; Fujioka, Masaya; Nishii, Junji; Xiao, Gang.

In: Scientific reports, Vol. 8, No. 1, 14709, 01.12.2018.

Research output: Contribution to journalArticle

Kaiju, H, Misawa, T, Nagahama, T, Komine, T, Kitakami, O, Fujioka, M, Nishii, J & Xiao, G 2018, 'Robustness of Voltage-induced Magnetocapacitance', Scientific reports, vol. 8, no. 1, 14709. https://doi.org/10.1038/s41598-018-33065-y
Kaiju H, Misawa T, Nagahama T, Komine T, Kitakami O, Fujioka M et al. Robustness of Voltage-induced Magnetocapacitance. Scientific reports. 2018 Dec 1;8(1). 14709. https://doi.org/10.1038/s41598-018-33065-y
Kaiju, Hideo ; Misawa, Takahiro ; Nagahama, Taro ; Komine, Takashi ; Kitakami, Osamu ; Fujioka, Masaya ; Nishii, Junji ; Xiao, Gang. / Robustness of Voltage-induced Magnetocapacitance. In: Scientific reports. 2018 ; Vol. 8, No. 1.
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