S K-edge X-ray absorption fine structure study of vacuum-deposited dihexyldisulfide on Ag(100)

H. Kondoh, H. Tsukabayashi, T. Yokoyama, T. Ohta

Research output: Contribution to journalArticle

20 Citations (Scopus)

Abstract

Local structure around the sulfur atoms of vacuum-deposited dihexyldisulfide on Ag(100) was studied by use of S K-edge X-ray absorption fine structure (XAFS) spectroscopy. It turned out that the S-S bond of disulfide is cleaved on adsorption and hexanethiolate monolayers are formed on Ag(100). Surface XAFS analysis revealed that S of the thiolate is located on the fourfold hollow site of Ag(100) without reconstruction. The bond distances, R(S-Ag) and R(S-C) are determined to be 2.53±0.02 and 1.81±0.04 Å, respectively.

Original languageEnglish
Pages (from-to)20-28
Number of pages9
JournalSurface Science
Volume489
Issue number1-3
DOIs
Publication statusPublished - 2001 Aug 20
Externally publishedYes

Keywords

  • Extended X-ray absorption fine structure (EXAFS)
  • Near edge extended X-ray absorption fine structure (NEXAFS)
  • Self-assembly
  • Silver
  • Sulphides
  • X-ray absorption spectroscopy

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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