Scanning electron microscopy of negatively stained catalase on a silicon wafer

Taiji Furuno, K. M. Ulmer, H. Sasabe

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

A high-resolution scanning electron microscope capable of 7 Å spatial resolution at 30-kV accelerating voltage was used to observe negatively stained protein molecules. Thin platelet crystals, densely packed monolayers, and low-density deposits of beef liver catalase were prepared on the surface of silicon wafers and negatively stained with phosphotungstic acid. The tetrameric structure of the catalase molecule was observed for the first time by scanning electron microscopy on the surface of the smooth silicon wafer.

Original languageEnglish
Pages (from-to)32-38
Number of pages7
JournalMicroscopy Research and Technique
Volume21
Issue number1
DOIs
Publication statusPublished - 1992
Externally publishedYes

Fingerprint

catalase
Silicon
silicon
Silicon wafers
Electron Scanning Microscopy
Catalase
scanning electron microscopy
Phosphotungstic Acid
wafers
phosphotungstic acid
Beef
Scanning electron microscopy
Molecules
Platelets
platelets
scanning electron microscopes
liver
Liver
crystals
molecules

Keywords

  • High-resolution scanning electron microscope (HRSEM)
  • Negative staining
  • Surface

ASJC Scopus subject areas

  • Agricultural and Biological Sciences(all)
  • Anatomy
  • Instrumentation

Cite this

Scanning electron microscopy of negatively stained catalase on a silicon wafer. / Furuno, Taiji; Ulmer, K. M.; Sasabe, H.

In: Microscopy Research and Technique, Vol. 21, No. 1, 1992, p. 32-38.

Research output: Contribution to journalArticle

Furuno, Taiji ; Ulmer, K. M. ; Sasabe, H. / Scanning electron microscopy of negatively stained catalase on a silicon wafer. In: Microscopy Research and Technique. 1992 ; Vol. 21, No. 1. pp. 32-38.
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