Secure outage probability over κ-μ Fading channels

Shunya Iwata, Tomoaki Ohtsuki, P. Y. Kam

Research output: Chapter in Book/Report/Conference proceedingConference contribution

5 Citations (Scopus)

Abstract

In this paper, we derive the analytical expressions for the secure outage probability in a single-input single-output (SISO) system over fading, in which both the main and eavesdropper channels are subject to κ-μ fading. Many authors have analyzed the secrecy performance of such a SISO system over various fading models. More recently, a lower bound on the secure outage probability over κ-μ fading has been reported. However, the exact analytical expression of secure outage probability over κ-μ fading has not been obtained. The problem with using the lower bound is that we are not sure about the tightness of the bound. Our result is an exact expression which is verified by Monte-Carlo simulations. Furthermore, it enables us to examine the behavior of the secure outage probability as a function of the fading parameters of both the main and eavesdropper channels for given values of the average signal-to-noise power ratio (SNR) over these channels. Exact expressions for the case of Nakagami-m and Rician fading models for both the main and eavesdropper channels are also obtained and verified by simulations.

Original languageEnglish
Title of host publication2017 IEEE International Conference on Communications, ICC 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781467389990
DOIs
Publication statusPublished - 2017 Jul 28
Event2017 IEEE International Conference on Communications, ICC 2017 - Paris, France
Duration: 2017 May 212017 May 25

Other

Other2017 IEEE International Conference on Communications, ICC 2017
CountryFrance
CityParis
Period17/5/2117/5/25

Keywords

  • Nakagami-m fading channel
  • Physical layer security
  • probability of strictly positive secrecy capacity
  • Rician fading channel
  • secure outage probability
  • κ - μ fading channel

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Electrical and Electronic Engineering

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