Semi-Supervised learning for electron microscopy image segmentation

Eichi Takaya, Yusuke Takeichi, Mamiko Ozaki, Satoshi Kurihara

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019
PublisherAAAI press
Pages10047-10048
Number of pages2
ISBN (Electronic)9781577358091
Publication statusPublished - 2019
Event33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019 - Honolulu, United States
Duration: 2019 Jan 272019 Feb 1

Publication series

Name33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Innovative Applications of Artificial Intelligence Conference, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019

Conference

Conference33rd AAAI Conference on Artificial Intelligence, AAAI 2019, 31st Annual Conference on Innovative Applications of Artificial Intelligence, IAAI 2019 and the 9th AAAI Symposium on Educational Advances in Artificial Intelligence, EAAI 2019
CountryUnited States
CityHonolulu
Period19/1/2719/2/1

ASJC Scopus subject areas

  • Artificial Intelligence

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