Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships

Takashi Sawai, Akihisa Kamataki, Miwa Uzuki, Kinji Ishida, Tomohito Hanasaka, Kensuke Ochi, Takahito Hashimoto, Takashi Kubo, Akinari Morikawa, Takahiro Ochi, Koujiro Tohyama

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

To evaluate the advantages of combination of two advanced electron microscopic technologies such as serial block-face scanning electron microscopy and double-axis electron beam tomography, we analyzed the three-dimensional morphology of cellular relationships between dendritic and plasma cells in the synovial membrane from patients with rheumatoid arthritis, using the combined approach.

Original languageEnglish
Pages (from-to)317-320
Number of pages4
JournalJournal of Electron Microscopy
Volume62
Issue number2
DOIs
Publication statusPublished - 2013 Apr
Externally publishedYes

Fingerprint

arthritis
X Ray Computed Tomography
Synovial Membrane
Plasma Cells
Electron Scanning Microscopy
Dendritic Cells
Tomography
Electron beams
Rheumatoid Arthritis
tomography
electron beams
Electrons
membranes
Technology
Membranes
Plasmas
Scanning electron microscopy
scanning electron microscopy
cells
electrons

Keywords

  • 3-D
  • back-scattered image
  • cell fusion
  • double-axis EM tomography
  • rheumatoid arthritis
  • serial block-face SEM

ASJC Scopus subject areas

  • Instrumentation

Cite this

Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships. / Sawai, Takashi; Kamataki, Akihisa; Uzuki, Miwa; Ishida, Kinji; Hanasaka, Tomohito; Ochi, Kensuke; Hashimoto, Takahito; Kubo, Takashi; Morikawa, Akinari; Ochi, Takahiro; Tohyama, Koujiro.

In: Journal of Electron Microscopy, Vol. 62, No. 2, 04.2013, p. 317-320.

Research output: Contribution to journalArticle

Sawai, T, Kamataki, A, Uzuki, M, Ishida, K, Hanasaka, T, Ochi, K, Hashimoto, T, Kubo, T, Morikawa, A, Ochi, T & Tohyama, K 2013, 'Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships', Journal of Electron Microscopy, vol. 62, no. 2, pp. 317-320. https://doi.org/10.1093/jmicro/dfs069
Sawai, Takashi ; Kamataki, Akihisa ; Uzuki, Miwa ; Ishida, Kinji ; Hanasaka, Tomohito ; Ochi, Kensuke ; Hashimoto, Takahito ; Kubo, Takashi ; Morikawa, Akinari ; Ochi, Takahiro ; Tohyama, Koujiro. / Serial block-face scanning electron microscopy combined with double-axis electron beam tomography provides new insight into cellular relationships. In: Journal of Electron Microscopy. 2013 ; Vol. 62, No. 2. pp. 317-320.
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