Silicon qubit fidelities approaching incoherent noise limits via pulse engineering

C. H. Yang, K. W. Chan, R. Harper, W. Huang, T. Evans, J. C.C. Hwang, B. Hensen, A. Laucht, T. Tanttu, F. E. Hudson, S. T. Flammia, Kohei M Itoh, A. Morello, S. D. Bartlett, A. S. Dzurak

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Spin qubits created from gate-defined silicon metal–oxide–semiconductor quantum dots are a promising architecture for quantum computation. The high single qubit fidelities possible in these systems, combined with quantum error correcting codes, could potentially offer a route to fault-tolerant quantum computing. To achieve fault tolerance, however, gate error rates must be reduced to below a certain threshold and, in general, correlated errors must be removed. Here we show that pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043%. This represents a factor of three improvement over state-of-the-art silicon quantum dot devices and extends the randomized benchmarking coherence time to 9.4 ms. By including tomographically complete measurements in our randomized benchmarking, we infer a higher-order feature of the noise called the unitarity, which measures the coherence of noise. This, in turn, allows us to theoretically predict that average gate error rates as low as 0.026% may be achievable with further pulse improvements. These spin qubit fidelities are ultimately limited by incoherent noise, which we attribute to charge noise from the silicon device structure or the environment.

Original languageEnglish
Pages (from-to)151-158
Number of pages8
JournalNature Electronics
Volume2
Issue number4
DOIs
Publication statusPublished - 2019 Apr 1

Fingerprint

Silicon
engineering
quantum dots
Semiconductor quantum dots
silicon
quantum computation
pulses
Benchmarking
error correcting codes
fault tolerance
Quantum computers
Fault tolerance
routes
thresholds

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Instrumentation

Cite this

Yang, C. H., Chan, K. W., Harper, R., Huang, W., Evans, T., Hwang, J. C. C., ... Dzurak, A. S. (2019). Silicon qubit fidelities approaching incoherent noise limits via pulse engineering. Nature Electronics, 2(4), 151-158. https://doi.org/10.1038/s41928-019-0234-1

Silicon qubit fidelities approaching incoherent noise limits via pulse engineering. / Yang, C. H.; Chan, K. W.; Harper, R.; Huang, W.; Evans, T.; Hwang, J. C.C.; Hensen, B.; Laucht, A.; Tanttu, T.; Hudson, F. E.; Flammia, S. T.; Itoh, Kohei M; Morello, A.; Bartlett, S. D.; Dzurak, A. S.

In: Nature Electronics, Vol. 2, No. 4, 01.04.2019, p. 151-158.

Research output: Contribution to journalArticle

Yang, CH, Chan, KW, Harper, R, Huang, W, Evans, T, Hwang, JCC, Hensen, B, Laucht, A, Tanttu, T, Hudson, FE, Flammia, ST, Itoh, KM, Morello, A, Bartlett, SD & Dzurak, AS 2019, 'Silicon qubit fidelities approaching incoherent noise limits via pulse engineering', Nature Electronics, vol. 2, no. 4, pp. 151-158. https://doi.org/10.1038/s41928-019-0234-1
Yang, C. H. ; Chan, K. W. ; Harper, R. ; Huang, W. ; Evans, T. ; Hwang, J. C.C. ; Hensen, B. ; Laucht, A. ; Tanttu, T. ; Hudson, F. E. ; Flammia, S. T. ; Itoh, Kohei M ; Morello, A. ; Bartlett, S. D. ; Dzurak, A. S. / Silicon qubit fidelities approaching incoherent noise limits via pulse engineering. In: Nature Electronics. 2019 ; Vol. 2, No. 4. pp. 151-158.
@article{eb006768ac95424c9500d9762d6a3475,
title = "Silicon qubit fidelities approaching incoherent noise limits via pulse engineering",
abstract = "Spin qubits created from gate-defined silicon metal–oxide–semiconductor quantum dots are a promising architecture for quantum computation. The high single qubit fidelities possible in these systems, combined with quantum error correcting codes, could potentially offer a route to fault-tolerant quantum computing. To achieve fault tolerance, however, gate error rates must be reduced to below a certain threshold and, in general, correlated errors must be removed. Here we show that pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043{\%}. This represents a factor of three improvement over state-of-the-art silicon quantum dot devices and extends the randomized benchmarking coherence time to 9.4 ms. By including tomographically complete measurements in our randomized benchmarking, we infer a higher-order feature of the noise called the unitarity, which measures the coherence of noise. This, in turn, allows us to theoretically predict that average gate error rates as low as 0.026{\%} may be achievable with further pulse improvements. These spin qubit fidelities are ultimately limited by incoherent noise, which we attribute to charge noise from the silicon device structure or the environment.",
author = "Yang, {C. H.} and Chan, {K. W.} and R. Harper and W. Huang and T. Evans and Hwang, {J. C.C.} and B. Hensen and A. Laucht and T. Tanttu and Hudson, {F. E.} and Flammia, {S. T.} and Itoh, {Kohei M} and A. Morello and Bartlett, {S. D.} and Dzurak, {A. S.}",
year = "2019",
month = "4",
day = "1",
doi = "10.1038/s41928-019-0234-1",
language = "English",
volume = "2",
pages = "151--158",
journal = "Nature Electronics",
issn = "2520-1131",
publisher = "Nature Publishing Group",
number = "4",

}

TY - JOUR

T1 - Silicon qubit fidelities approaching incoherent noise limits via pulse engineering

AU - Yang, C. H.

AU - Chan, K. W.

AU - Harper, R.

AU - Huang, W.

AU - Evans, T.

AU - Hwang, J. C.C.

AU - Hensen, B.

AU - Laucht, A.

AU - Tanttu, T.

AU - Hudson, F. E.

AU - Flammia, S. T.

AU - Itoh, Kohei M

AU - Morello, A.

AU - Bartlett, S. D.

AU - Dzurak, A. S.

PY - 2019/4/1

Y1 - 2019/4/1

N2 - Spin qubits created from gate-defined silicon metal–oxide–semiconductor quantum dots are a promising architecture for quantum computation. The high single qubit fidelities possible in these systems, combined with quantum error correcting codes, could potentially offer a route to fault-tolerant quantum computing. To achieve fault tolerance, however, gate error rates must be reduced to below a certain threshold and, in general, correlated errors must be removed. Here we show that pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043%. This represents a factor of three improvement over state-of-the-art silicon quantum dot devices and extends the randomized benchmarking coherence time to 9.4 ms. By including tomographically complete measurements in our randomized benchmarking, we infer a higher-order feature of the noise called the unitarity, which measures the coherence of noise. This, in turn, allows us to theoretically predict that average gate error rates as low as 0.026% may be achievable with further pulse improvements. These spin qubit fidelities are ultimately limited by incoherent noise, which we attribute to charge noise from the silicon device structure or the environment.

AB - Spin qubits created from gate-defined silicon metal–oxide–semiconductor quantum dots are a promising architecture for quantum computation. The high single qubit fidelities possible in these systems, combined with quantum error correcting codes, could potentially offer a route to fault-tolerant quantum computing. To achieve fault tolerance, however, gate error rates must be reduced to below a certain threshold and, in general, correlated errors must be removed. Here we show that pulse engineering techniques can be used to reduce the average Clifford gate error rates for silicon quantum dot spin qubits down to 0.043%. This represents a factor of three improvement over state-of-the-art silicon quantum dot devices and extends the randomized benchmarking coherence time to 9.4 ms. By including tomographically complete measurements in our randomized benchmarking, we infer a higher-order feature of the noise called the unitarity, which measures the coherence of noise. This, in turn, allows us to theoretically predict that average gate error rates as low as 0.026% may be achievable with further pulse improvements. These spin qubit fidelities are ultimately limited by incoherent noise, which we attribute to charge noise from the silicon device structure or the environment.

UR - http://www.scopus.com/inward/record.url?scp=85064530530&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85064530530&partnerID=8YFLogxK

U2 - 10.1038/s41928-019-0234-1

DO - 10.1038/s41928-019-0234-1

M3 - Article

VL - 2

SP - 151

EP - 158

JO - Nature Electronics

JF - Nature Electronics

SN - 2520-1131

IS - 4

ER -