### Abstract

This paper presents a new computational approach to simulate impact response of a large TFT-LCD panel. The approach is based on the static load analysis equivalent to impact analysis. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress. To show the plausibility of the proposed approach, it is applied to a simple, idealized problem, a beam subject to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, time variation of energy within the beam is investigated systematically, from which the steady state internal energy stored in the beam and the maximum stress are characterized in terms of the shock duration. Noting that the maximum stress is related to the internal energy, an equivalent static problem to the impact problem is found by equating the strain energy to the internal energy. Comparison of the maximum stress for the equivalent static problem with that for the impact problem shows that the ratio can be uniquely characterized by the shock duration, and moreover varies slightly, from 1.2 to 1.0, which suggests that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Thus the proposed approach provides significant advantages in design optimization of a large TFT-LCD monitor against chock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened.

Original language | English |
---|---|

Pages (from-to) | 114-119 |

Number of pages | 6 |

Journal | Key Engineering Materials |

Volume | 270-273 |

Issue number | I |

Publication status | Published - 2004 Nov 25 |

Externally published | Yes |

Event | Proceedings of the 11th Asian Pacific Conference on Nondestructive Testing - Jeju Island, Korea, Republic of Duration: 2003 Nov 3 → 2003 Nov 7 |

### Fingerprint

### Keywords

- Energy
- Impact Analysis
- Static Analysis
- TFT-LCD

### ASJC Scopus subject areas

- Materials Science(all)
- Mechanics of Materials
- Mechanical Engineering

### Cite this

*Key Engineering Materials*,

*270-273*(I), 114-119.

**Simplified impact analysis based on equivalent static analysis for impact design of TFT-LCD panels.** / Kim, Yun Jae; Koo, J. C.; Moon, Seong In; Kim, Young Jin.

Research output: Contribution to journal › Conference article

*Key Engineering Materials*, vol. 270-273, no. I, pp. 114-119.

}

TY - JOUR

T1 - Simplified impact analysis based on equivalent static analysis for impact design of TFT-LCD panels

AU - Kim, Yun Jae

AU - Koo, J. C.

AU - Moon, Seong In

AU - Kim, Young Jin

PY - 2004/11/25

Y1 - 2004/11/25

N2 - This paper presents a new computational approach to simulate impact response of a large TFT-LCD panel. The approach is based on the static load analysis equivalent to impact analysis. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress. To show the plausibility of the proposed approach, it is applied to a simple, idealized problem, a beam subject to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, time variation of energy within the beam is investigated systematically, from which the steady state internal energy stored in the beam and the maximum stress are characterized in terms of the shock duration. Noting that the maximum stress is related to the internal energy, an equivalent static problem to the impact problem is found by equating the strain energy to the internal energy. Comparison of the maximum stress for the equivalent static problem with that for the impact problem shows that the ratio can be uniquely characterized by the shock duration, and moreover varies slightly, from 1.2 to 1.0, which suggests that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Thus the proposed approach provides significant advantages in design optimization of a large TFT-LCD monitor against chock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened.

AB - This paper presents a new computational approach to simulate impact response of a large TFT-LCD panel. The approach is based on the static load analysis equivalent to impact analysis. The static problem equivalent to the impact one is found from the concept of solid mechanics to estimate the maximum deflection and stress. To show the plausibility of the proposed approach, it is applied to a simple, idealized problem, a beam subject to impact loading. Based on explicit FE analyses using the LS-DYNA FE program, time variation of energy within the beam is investigated systematically, from which the steady state internal energy stored in the beam and the maximum stress are characterized in terms of the shock duration. Noting that the maximum stress is related to the internal energy, an equivalent static problem to the impact problem is found by equating the strain energy to the internal energy. Comparison of the maximum stress for the equivalent static problem with that for the impact problem shows that the ratio can be uniquely characterized by the shock duration, and moreover varies slightly, from 1.2 to 1.0, which suggests that the impact problem can be solved by the equivalent static analysis which is much easier to solve in practice. Thus the proposed approach provides significant advantages in design optimization of a large TFT-LCD monitor against chock failure, and enables the designer to avoid ad hoc modeling of the transient dynamics so that product design cycle could be shortened.

KW - Energy

KW - Impact Analysis

KW - Static Analysis

KW - TFT-LCD

UR - http://www.scopus.com/inward/record.url?scp=8644230892&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=8644230892&partnerID=8YFLogxK

M3 - Conference article

AN - SCOPUS:8644230892

VL - 270-273

SP - 114

EP - 119

JO - Key Engineering Materials

JF - Key Engineering Materials

SN - 1013-9826

IS - I

ER -