Single-electron random-number generator (RNG) for highly secure ubiquitous computing applications

Ken Uchida, Tetsufumi Tanamoto, Ryuji Ohba, Shin Ichi Yasuda, Shinobu Fujita

    Research output: Contribution to journalConference article

    15 Citations (Scopus)

    Abstract

    We propose a new random-number generator (RNG), which utilizes single-electron phenomena. It is confirmed that the proposed single-electron RNG generates extremely high-quality random digital sequences in spite of its simple configuration. Because of its small-size and low-power properties, the single-electron RNG is promising as a key device for future ubiquitous computing with highly secure communication capabilities.

    Original languageEnglish
    Pages (from-to)177-180
    Number of pages4
    JournalTechnical Digest - International Electron Devices Meeting
    Publication statusPublished - 2002 Dec 1
    Event2002 IEEE International Devices Meeting (IEDM) - San Francisco, CA, United States
    Duration: 2002 Dec 82002 Dec 11

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Electrical and Electronic Engineering
    • Materials Chemistry

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