Some notions on testing generated fault hypotheses

Yusuf Wilajati Purna, Takahira Yamaguchi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 7th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 1994
EditorsMoonis Ali, Rita V. Rodriguez, Frank D. Anger
PublisherAssociation for Computing Machinery, Inc
Pages447-455
Number of pages9
ISBN (Print)2884491287, 9782884491280
Publication statusPublished - 1994 May 31
Externally publishedYes
Event7th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 1994 - Austin, United States
Duration: 1994 May 311994 Jun 3

Other

Other7th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 1994
CountryUnited States
CityAustin
Period94/5/3194/6/3

ASJC Scopus subject areas

  • Industrial and Manufacturing Engineering
  • Artificial Intelligence
  • Computer Science Applications
  • Control and Systems Engineering

Cite this

Purna, Y. W., & Yamaguchi, T. (1994). Some notions on testing generated fault hypotheses. In M. Ali, R. V. Rodriguez, & F. D. Anger (Eds.), Proceedings of the 7th International Conference on Industrial and Engineering Applications of Artificial Intelligence and Expert Systems, IEA/AIE 1994 (pp. 447-455). Association for Computing Machinery, Inc.