Spatio-temporal imaging of terahertz electric-field vectors: Observation of polarization-dependent knife-edge diffraction

Kenta Suzuki, Kenichi Oguchi, Yasuaki Monnai, Makoto Okano, Shinichi Watanabe

Research output: Contribution to journalArticle

Abstract

We develop a terahertz electric-field vector imaging system that uses the rotating polarizer technique. The imaging system is used to investigate the polarization-dependent optical response of a patterned indium tin oxide (ITO) film deposited on a glass substrate. While ITO is transparent for near-infrared probe light, it acts as a metal for terahertz light. Therefore, polarization-dependent diffraction can be observed at the edge of the ITO thin film, and only electric field components perpendicular to the edge boundary can propagate behind the ITO layer. By comparison with a numerical simulation, we reveal the polarization dependence of this so-called knife-edge diffraction.

Original languageEnglish
Article number052010
JournalApplied Physics Express
Volume12
Issue number5
DOIs
Publication statusPublished - 2019 Jan 1

Fingerprint

Tin oxides
indium oxides
Indium
tin oxides
Diffraction
Electric fields
Polarization
Imaging techniques
electric fields
polarization
diffraction
Imaging systems
Oxide films
polarizers
light beams
oxide films
Infrared radiation
Glass
Thin films
glass

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

@article{8a1b20476faa40aab2393f0dcfece632,
title = "Spatio-temporal imaging of terahertz electric-field vectors: Observation of polarization-dependent knife-edge diffraction",
abstract = "We develop a terahertz electric-field vector imaging system that uses the rotating polarizer technique. The imaging system is used to investigate the polarization-dependent optical response of a patterned indium tin oxide (ITO) film deposited on a glass substrate. While ITO is transparent for near-infrared probe light, it acts as a metal for terahertz light. Therefore, polarization-dependent diffraction can be observed at the edge of the ITO thin film, and only electric field components perpendicular to the edge boundary can propagate behind the ITO layer. By comparison with a numerical simulation, we reveal the polarization dependence of this so-called knife-edge diffraction.",
author = "Kenta Suzuki and Kenichi Oguchi and Yasuaki Monnai and Makoto Okano and Shinichi Watanabe",
year = "2019",
month = "1",
day = "1",
doi = "10.7567/1882-0786/ab12fc",
language = "English",
volume = "12",
journal = "Applied Physics Express",
issn = "1882-0778",
publisher = "Japan Society of Applied Physics",
number = "5",

}

TY - JOUR

T1 - Spatio-temporal imaging of terahertz electric-field vectors

T2 - Observation of polarization-dependent knife-edge diffraction

AU - Suzuki, Kenta

AU - Oguchi, Kenichi

AU - Monnai, Yasuaki

AU - Okano, Makoto

AU - Watanabe, Shinichi

PY - 2019/1/1

Y1 - 2019/1/1

N2 - We develop a terahertz electric-field vector imaging system that uses the rotating polarizer technique. The imaging system is used to investigate the polarization-dependent optical response of a patterned indium tin oxide (ITO) film deposited on a glass substrate. While ITO is transparent for near-infrared probe light, it acts as a metal for terahertz light. Therefore, polarization-dependent diffraction can be observed at the edge of the ITO thin film, and only electric field components perpendicular to the edge boundary can propagate behind the ITO layer. By comparison with a numerical simulation, we reveal the polarization dependence of this so-called knife-edge diffraction.

AB - We develop a terahertz electric-field vector imaging system that uses the rotating polarizer technique. The imaging system is used to investigate the polarization-dependent optical response of a patterned indium tin oxide (ITO) film deposited on a glass substrate. While ITO is transparent for near-infrared probe light, it acts as a metal for terahertz light. Therefore, polarization-dependent diffraction can be observed at the edge of the ITO thin film, and only electric field components perpendicular to the edge boundary can propagate behind the ITO layer. By comparison with a numerical simulation, we reveal the polarization dependence of this so-called knife-edge diffraction.

UR - http://www.scopus.com/inward/record.url?scp=85065660056&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85065660056&partnerID=8YFLogxK

U2 - 10.7567/1882-0786/ab12fc

DO - 10.7567/1882-0786/ab12fc

M3 - Article

AN - SCOPUS:85065660056

VL - 12

JO - Applied Physics Express

JF - Applied Physics Express

SN - 1882-0778

IS - 5

M1 - 052010

ER -