Spin-dependent CPP transport properties of semiconductive-oxide/ferromagnet multilayers

Y. Nozaki; Y. Maeda; K. Matsuyama

doi:10.1016/S0304-8853(01)00537-6

Spin-dependent CPP transport properties of semiconductive-oxide/ferromagnet multilayers

Y. Nozaki, Y. Maeda, K. Matsuyama

Research output: Contribution to journal › Article › peer-review

Abstract

The spin-dependent CPP (current perpendicular to plane) transport properties in semiconductive-oxide(MO_x)/ferromagnet multilayers consisting of CoPt/Co/MO_x/Co/MO_x/Co/CoPt, where M = Ti, Sn, were investigated by magneto-transport measurement. The XRD patterns reveal that the structures of sputtered MO_x films are amorphous or nanocrystalline. The MR ratio of a TiO_x-based multilayer (0.43%) was much smaller than that of a SnO_x-based one (2.0%) at T = 77 K. As inferred from the shape of MR curves with a large saturation field above 4kOe, suppressed MR change in the TiO_x-based multilayer is caused by the interlayer diffusion of Co atoms into the TiO_x layer. The same behavior was not observed in the SnO_x-based one. The MR ratio was reduced by half on increasing t_SnO(x) from 4 to 8 nm. This decrease can be ascribed to the scattering of the spin-polarized electron in the SnO_x layer.

Original language	English
Pages (from-to)	157-159
Number of pages	3
Journal	Journal of Magnetism and Magnetic Materials
Volume	239
Issue number	1-3
DOIs	https://doi.org/10.1016/S0304-8853(01)00537-6
Publication status	Published - 2002 Feb
Externally published	Yes

Keywords

CPP transport
Oxides
Spin dependent transport

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1016/S0304-8853(01)00537-6

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title = "Spin-dependent CPP transport properties of semiconductive-oxide/ferromagnet multilayers",

abstract = "The spin-dependent CPP (current perpendicular to plane) transport properties in semiconductive-oxide(MOx)/ferromagnet multilayers consisting of CoPt/Co/MOx/Co/MOx/Co/CoPt, where M = Ti, Sn, were investigated by magneto-transport measurement. The XRD patterns reveal that the structures of sputtered MOx films are amorphous or nanocrystalline. The MR ratio of a TiOx-based multilayer (0.43%) was much smaller than that of a SnOx-based one (2.0%) at T = 77 K. As inferred from the shape of MR curves with a large saturation field above 4kOe, suppressed MR change in the TiOx-based multilayer is caused by the interlayer diffusion of Co atoms into the TiOx layer. The same behavior was not observed in the SnOx-based one. The MR ratio was reduced by half on increasing tSnO(x) from 4 to 8 nm. This decrease can be ascribed to the scattering of the spin-polarized electron in the SnOx layer.",

keywords = "CPP transport, Oxides, Spin dependent transport",

author = "Y. Nozaki and Y. Maeda and K. Matsuyama",

year = "2002",

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doi = "10.1016/S0304-8853(01)00537-6",

language = "English",

volume = "239",

pages = "157--159",

journal = "Journal of Magnetism and Magnetic Materials",

issn = "0304-8853",

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TY - JOUR

T1 - Spin-dependent CPP transport properties of semiconductive-oxide/ferromagnet multilayers

AU - Nozaki, Y.

AU - Maeda, Y.

AU - Matsuyama, K.

PY - 2002/2

Y1 - 2002/2

N2 - The spin-dependent CPP (current perpendicular to plane) transport properties in semiconductive-oxide(MOx)/ferromagnet multilayers consisting of CoPt/Co/MOx/Co/MOx/Co/CoPt, where M = Ti, Sn, were investigated by magneto-transport measurement. The XRD patterns reveal that the structures of sputtered MOx films are amorphous or nanocrystalline. The MR ratio of a TiOx-based multilayer (0.43%) was much smaller than that of a SnOx-based one (2.0%) at T = 77 K. As inferred from the shape of MR curves with a large saturation field above 4kOe, suppressed MR change in the TiOx-based multilayer is caused by the interlayer diffusion of Co atoms into the TiOx layer. The same behavior was not observed in the SnOx-based one. The MR ratio was reduced by half on increasing tSnO(x) from 4 to 8 nm. This decrease can be ascribed to the scattering of the spin-polarized electron in the SnOx layer.

AB - The spin-dependent CPP (current perpendicular to plane) transport properties in semiconductive-oxide(MOx)/ferromagnet multilayers consisting of CoPt/Co/MOx/Co/MOx/Co/CoPt, where M = Ti, Sn, were investigated by magneto-transport measurement. The XRD patterns reveal that the structures of sputtered MOx films are amorphous or nanocrystalline. The MR ratio of a TiOx-based multilayer (0.43%) was much smaller than that of a SnOx-based one (2.0%) at T = 77 K. As inferred from the shape of MR curves with a large saturation field above 4kOe, suppressed MR change in the TiOx-based multilayer is caused by the interlayer diffusion of Co atoms into the TiOx layer. The same behavior was not observed in the SnOx-based one. The MR ratio was reduced by half on increasing tSnO(x) from 4 to 8 nm. This decrease can be ascribed to the scattering of the spin-polarized electron in the SnOx layer.

KW - CPP transport

KW - Oxides

KW - Spin dependent transport

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U2 - 10.1016/S0304-8853(01)00537-6

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VL - 239

SP - 157

EP - 159

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

IS - 1-3

ER -

Spin-dependent CPP transport properties of semiconductive-oxide/ferromagnet multilayers

Abstract

Keywords

ASJC Scopus subject areas

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