Split capacitor DAC mismatch calibration in successive approximation ADC

Yanfei Chen, Xiaolei Zhu, Hirotaka Tamura, Masaya Kibune, Yasumoto Tomita, Takayuki Hamada, Masato Yoshioka, Kiyoshi Ishikawa, Takeshi Takayama, Junji Ogawa, Sanroku Tsukamoto, Tadahiro Kuroda

Research output: Chapter in Book/Report/Conference proceedingConference contribution

98 Citations (Scopus)

Abstract

A split capacitor DAC calibration method is proposed that a bridge capacitor larger than conventional design allows a tunable capacitor to compensate for mismatch. To guarantee proper calibration, a comparator with digital timing control offset cancellation is proposed. An 8-bit successive approximation ADC with 4b+4b split capacitor DAC calibration has been implemented in 65nm CMOS, achieving 0.3LSB DNL and INL with 180fF input capacitance.

Original languageEnglish
Title of host publicationProceedings of the Custom Integrated Circuits Conference
Pages279-282
Number of pages4
DOIs
Publication statusPublished - 2009
Event2009 IEEE Custom Integrated Circuits Conference, CICC '09 - San Jose, CA, United States
Duration: 2009 Sep 132009 Sep 16

Other

Other2009 IEEE Custom Integrated Circuits Conference, CICC '09
CountryUnited States
CitySan Jose, CA
Period09/9/1309/9/16

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Capacitors
Calibration
Capacitance

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Chen, Y., Zhu, X., Tamura, H., Kibune, M., Tomita, Y., Hamada, T., ... Kuroda, T. (2009). Split capacitor DAC mismatch calibration in successive approximation ADC. In Proceedings of the Custom Integrated Circuits Conference (pp. 279-282). [5280859] https://doi.org/10.1109/CICC.2009.5280859

Split capacitor DAC mismatch calibration in successive approximation ADC. / Chen, Yanfei; Zhu, Xiaolei; Tamura, Hirotaka; Kibune, Masaya; Tomita, Yasumoto; Hamada, Takayuki; Yoshioka, Masato; Ishikawa, Kiyoshi; Takayama, Takeshi; Ogawa, Junji; Tsukamoto, Sanroku; Kuroda, Tadahiro.

Proceedings of the Custom Integrated Circuits Conference. 2009. p. 279-282 5280859.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Chen, Y, Zhu, X, Tamura, H, Kibune, M, Tomita, Y, Hamada, T, Yoshioka, M, Ishikawa, K, Takayama, T, Ogawa, J, Tsukamoto, S & Kuroda, T 2009, Split capacitor DAC mismatch calibration in successive approximation ADC. in Proceedings of the Custom Integrated Circuits Conference., 5280859, pp. 279-282, 2009 IEEE Custom Integrated Circuits Conference, CICC '09, San Jose, CA, United States, 09/9/13. https://doi.org/10.1109/CICC.2009.5280859
Chen Y, Zhu X, Tamura H, Kibune M, Tomita Y, Hamada T et al. Split capacitor DAC mismatch calibration in successive approximation ADC. In Proceedings of the Custom Integrated Circuits Conference. 2009. p. 279-282. 5280859 https://doi.org/10.1109/CICC.2009.5280859
Chen, Yanfei ; Zhu, Xiaolei ; Tamura, Hirotaka ; Kibune, Masaya ; Tomita, Yasumoto ; Hamada, Takayuki ; Yoshioka, Masato ; Ishikawa, Kiyoshi ; Takayama, Takeshi ; Ogawa, Junji ; Tsukamoto, Sanroku ; Kuroda, Tadahiro. / Split capacitor DAC mismatch calibration in successive approximation ADC. Proceedings of the Custom Integrated Circuits Conference. 2009. pp. 279-282
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AU - Hamada, Takayuki

AU - Yoshioka, Masato

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