Structural and electronic characterization of epitaxially-grown ferroelectric vinylidene fluoride oligomer thin films

K. Ishida, Kei Noda, A. Kubono, T. Horiuchi, H. Yamada, K. Matsushige

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

The structural and electric properties of newly synthesized vinylidene fluoride (VDF) oligomer thin films evaporated on various substrate were investigated. The structural behavior of the VDF oligomer thin films strongly depended on the kinds of substrate and substrate temperature during film preparation. In particular, the VDF oligomers epitaxially grew on KBr(001), aligned their molecular chain along the 〈110〉 direction of substrate surface, and were similar to polar Form I-type crystals of poly(VDF). While, the thin films evaporated on NaCl(001), SiO2/Si were non-polar Form II-type or mixture of both Form I- and Form II-type crystals with their molecular chain normal to the surface. These facts indicated that crystal field of substrate, based on van der Waals and electrostatic interactions, strongly influenced to ferroelectric phase transition of the VDF oligomer. In addition, we demonstrate the formation of the local polarized domains in the epitaxial crystals by applying electric pulses from a conducting AFM probe used as a positionable top-electrode, and confirm their piezoelectricity of the VDF oligomers for the first time.

Original languageEnglish
Pages (from-to)101-106
Number of pages6
JournalUnknown Journal
Volume600
Publication statusPublished - 2000
Externally publishedYes

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Oligomers
Ferroelectric materials
Thin Films
Substrate
Electronics
electronics
Crystal
Thin films
Substrates
Crystals
Polar Form
Piezoelectricity
Film preparation
Van Der Waals
Phase Transition
SiO2
Coulomb interactions
Static Electricity
Electrostatics
Electrode

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Structural and electronic characterization of epitaxially-grown ferroelectric vinylidene fluoride oligomer thin films. / Ishida, K.; Noda, Kei; Kubono, A.; Horiuchi, T.; Yamada, H.; Matsushige, K.

In: Unknown Journal, Vol. 600, 2000, p. 101-106.

Research output: Contribution to journalArticle

Ishida, K, Noda, K, Kubono, A, Horiuchi, T, Yamada, H & Matsushige, K 2000, 'Structural and electronic characterization of epitaxially-grown ferroelectric vinylidene fluoride oligomer thin films', Unknown Journal, vol. 600, pp. 101-106.
Ishida, K. ; Noda, Kei ; Kubono, A. ; Horiuchi, T. ; Yamada, H. ; Matsushige, K. / Structural and electronic characterization of epitaxially-grown ferroelectric vinylidene fluoride oligomer thin films. In: Unknown Journal. 2000 ; Vol. 600. pp. 101-106.
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AU - Noda, Kei

AU - Kubono, A.

AU - Horiuchi, T.

AU - Yamada, H.

AU - Matsushige, K.

PY - 2000

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