Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM

Yasuo Nakayama; Hiroshi Kondoh; Toshiaki Ohta

doi:10.1016/j.susc.2004.01.020

Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM

Yasuo Nakayama, Hiroshi Kondoh, Toshiaki Ohta

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.

Original language	English
Pages (from-to)	53-62
Number of pages	10
Journal	Surface Science
Volume	552
Issue number	1-3
DOIs	https://doi.org/10.1016/j.susc.2004.01.020
Publication status	Published - 2004 Mar 10
Externally published	Yes

Keywords

Copper
Growth
Lanthanides
Low energy electron diffraction (LEED)
Scanning tunneling microscopy
Surface structure, morphology, roughness, and topography
X-ray photoelectron spectroscopy

ASJC Scopus subject areas

Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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title = "Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM",

abstract = "Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.",

keywords = "Copper, Growth, Lanthanides, Low energy electron diffraction (LEED), Scanning tunneling microscopy, Surface structure, morphology, roughness, and topography, X-ray photoelectron spectroscopy",

author = "Yasuo Nakayama and Hiroshi Kondoh and Toshiaki Ohta",

year = "2004",

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language = "English",

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journal = "Surface Science",

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T1 - Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM

AU - Nakayama, Yasuo

AU - Kondoh, Hiroshi

AU - Ohta, Toshiaki

PY - 2004/3/10

Y1 - 2004/3/10

N2 - Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.

AB - Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.

KW - Copper

KW - Growth

KW - Lanthanides

KW - Low energy electron diffraction (LEED)

KW - Scanning tunneling microscopy

KW - Surface structure, morphology, roughness, and topography

KW - X-ray photoelectron spectroscopy

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