Abstract
Geometric and electronic structures of adsorbed Sm on Cu(1 1 1) were studied by scanning tunneling microscopy (STM) and X-ray photoelectron spectroscopy (XPS). The surface morphology and Sm valency change with the Sm coverage, suggesting that Sm atoms in the islands have a valence of approximately 2.7 and those diffusing are divalent. Heating the adlayers yields surface alloy and close-packed overlayer of Sm depending on the coverage and temperature. Atomically resolved STM images indicate that the surface of the alloy phase is not rigid. The closed packed overlayer of a mixed valence Sm is observed as a uniform atomic species.
| Original language | English |
|---|---|
| Pages (from-to) | 53-62 |
| Number of pages | 10 |
| Journal | Surface Science |
| Volume | 552 |
| Issue number | 1-3 |
| DOIs | |
| Publication status | Published - 2004 Mar 10 |
| Externally published | Yes |
Keywords
- Copper
- Growth
- Lanthanides
- Low energy electron diffraction (LEED)
- Scanning tunneling microscopy
- Surface structure, morphology, roughness, and topography
- X-ray photoelectron spectroscopy
ASJC Scopus subject areas
- Condensed Matter Physics
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry
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Cite this
Nakayama, Y., Kondoh, H., & Ohta, T. (2004). Structure-dependent mixed valence of Sm on Cu(1 1 1) studied by XPS and STM. Surface Science, 552(1-3), 53-62. https://doi.org/10.1016/j.susc.2004.01.020