Study of band inversion in the PbxSn1-xTe class of topological crystalline insulators using x-ray absorption spectroscopy

K. V. Mitrofanov, A. V. Kolobov, P. Fons, M. Krbal, J. Tominaga, T. Uruga

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

PbxSn1-xTe and PbxSn1-xSe crystals belong to the class of topological crystalline insulators where topological protection is achieved due to crystal symmetry rather than time-reversal symmetry. In this work, we make use of selection rules in the x-ray absorption process to experimentally detect band inversion along the PbTe(Se)-SnTe(Se) tie-lines. The observed significant change in the ratio of intensities of L1 and L3 transitions along the tie-line demonstrates that x-ray absorption can be a useful tool to study band inversion in topological insulators.

Original languageEnglish
Article number475502
JournalJournal of Physics Condensed Matter
Volume26
Issue number47
DOIs
Publication statusPublished - 2014 Nov 26
Externally publishedYes

Keywords

  • band inversion
  • topological insulators
  • x-ray absorption

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics

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