Study of negative hydrogen ion beam optics using the 2D PIC method

K. Miyamoto, S. Okuda, A. Hatayama, M. Hanada, A. Kojima

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Citations (Scopus)

Abstract

We have developed the integrated 2D PIC code for the analysis of the negative ion beam optics, in which an overall region from the source plasma to the accelerator is modeled. Thus, the negative ion trajectory can be solved self-consistently without any assumption of the plasma meniscus form initially. This code can reproduce the negative ion beam halo observed in an actual negative ion beam. It is confirmed that the surface produced negative ions which are extracted near the edge of the meniscus can be one of the reasons for the beam halo: these negative ions are over-focused due to the curvature of the meniscus. The negative ions are not focused by the electrostatic lens, and consequently become the beam halo.

Original languageEnglish
Title of host publicationThird International Symposium on Negative Ions, Beams and Sources, NIBS 2012
Pages22-30
Number of pages9
DOIs
Publication statusPublished - 2013 Apr 12
Event3rd International Symposium on Negative Ions, Beams and Sources, NIBS 2012 - Jyvaskyla, Finland
Duration: 2012 Sep 32012 Sep 7

Publication series

NameAIP Conference Proceedings
Volume1515
ISSN (Print)0094-243X
ISSN (Electronic)1551-7616

Other

Other3rd International Symposium on Negative Ions, Beams and Sources, NIBS 2012
CountryFinland
CityJyvaskyla
Period12/9/312/9/7

Keywords

  • PIC
  • beam optics
  • negative ion source
  • simulation

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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  • Cite this

    Miyamoto, K., Okuda, S., Hatayama, A., Hanada, M., & Kojima, A. (2013). Study of negative hydrogen ion beam optics using the 2D PIC method. In Third International Symposium on Negative Ions, Beams and Sources, NIBS 2012 (pp. 22-30). (AIP Conference Proceedings; Vol. 1515). https://doi.org/10.1063/1.4792766