Study of negative ion beam emittance characteristic using 3D PIC-MCC simulation

K. Miyamoto, K. Nagaoka, A. Hatayama, K. Hoshino, H. Nakano, T. Shibata, K. Tsumori

Research output: Contribution to journalConference articlepeer-review

Abstract

It is reported from the measurement of a negative ion beamlet emittance that the characteristic three-Gaussian components are observed in the emittance diagram. The negative ion trajectories are calculated using 3D PIC-MCC simulation in order to clarify the origin of this complicated phase space structure and underlying physical mechanism. The characteristic three-Gaussian components can be reproduced in the emittance diagram from the simulation result. It is verified that the Gaussian components are caused by the negative ions extracted from the different plasma meniscus region, that is, the central region or the region near the edges of the meniscus.

Original languageEnglish
Article number012040
JournalJournal of Physics: Conference Series
Volume2244
Issue number1
DOIs
Publication statusPublished - 2022 Apr 25
Event19th International Conference on Ion Sources, ICIS 2021 - Virtual, Online
Duration: 2021 Sep 202021 Sep 24

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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