Surface morphology of ferromagnetic nickel thin films on polyethylene naphtalate organic films for spin quantum cross structures

Hideo Kaiju, Akito Ono, Akira Ishibashi

Research output: Contribution to journalArticle

Abstract

We investigated surface morphologies of Ni thin films evaporated on polyethylene naphtalate (PEN) organic substrates for the fabrication of spin quantum cross structures and discussed its feasibility toward ferromagnetic nanojunctions from a viewpoint of the Ni grain size and the Ni surface roughness. The grain size for Ni films of sub-10-nm thickness is ∼30 nm, which is larger than the Ni thickness, and the surface roughness, in the scanning scale of the film thickness, is less than 0.25 nm, corresponding to one-atomic-layer thickness. These experimental results indicate that spin quantum cross structures which consist of Ni thin films on PEN substrates can be expected as a candidate of ferromagnetic nanojunctions, which may lead to large magnetoresistance effect.

Original languageEnglish
Pages (from-to)211-213
Number of pages3
JournalJournal of the Vacuum Society of Japan
Volume51
Issue number3
DOIs
Publication statusPublished - 2008 Jan 1
Externally publishedYes

Fingerprint

Polyethylene
Nickel
Surface morphology
Polyethylenes
polyethylenes
Surface roughness
nickel
Thin films
surface roughness
Magnetoresistance
Substrates
thin films
grain size
Film thickness
Scanning
Fabrication
film thickness
fabrication
scanning

ASJC Scopus subject areas

  • Materials Science(all)
  • Instrumentation
  • Surfaces and Interfaces
  • Spectroscopy

Cite this

Surface morphology of ferromagnetic nickel thin films on polyethylene naphtalate organic films for spin quantum cross structures. / Kaiju, Hideo; Ono, Akito; Ishibashi, Akira.

In: Journal of the Vacuum Society of Japan, Vol. 51, No. 3, 01.01.2008, p. 211-213.

Research output: Contribution to journalArticle

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