Abstract
We investigated surface morphologies of Ni thin films evaporated on polyethylene naphtalate (PEN) organic substrates for the fabrication of spin quantum cross structures and discussed its feasibility toward ferromagnetic nanojunctions from a viewpoint of the Ni grain size and the Ni surface roughness. The grain size for Ni films of sub-10-nm thickness is ∼30 nm, which is larger than the Ni thickness, and the surface roughness, in the scanning scale of the film thickness, is less than 0.25 nm, corresponding to one-atomic-layer thickness. These experimental results indicate that spin quantum cross structures which consist of Ni thin films on PEN substrates can be expected as a candidate of ferromagnetic nanojunctions, which may lead to large magnetoresistance effect.
| Original language | English |
|---|---|
| Pages (from-to) | 211-213 |
| Number of pages | 3 |
| Journal | Journal of the Vacuum Society of Japan |
| Volume | 51 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2008 Jan 1 |
| Externally published | Yes |
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ASJC Scopus subject areas
- Materials Science(all)
- Instrumentation
- Surfaces and Interfaces
- Spectroscopy
Cite this
Surface morphology of ferromagnetic nickel thin films on polyethylene naphtalate organic films for spin quantum cross structures. / Kaiju, Hideo; Ono, Akito; Ishibashi, Akira.
In: Journal of the Vacuum Society of Japan, Vol. 51, No. 3, 01.01.2008, p. 211-213.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Surface morphology of ferromagnetic nickel thin films on polyethylene naphtalate organic films for spin quantum cross structures
AU - Kaiju, Hideo
AU - Ono, Akito
AU - Ishibashi, Akira
PY - 2008/1/1
Y1 - 2008/1/1
N2 - We investigated surface morphologies of Ni thin films evaporated on polyethylene naphtalate (PEN) organic substrates for the fabrication of spin quantum cross structures and discussed its feasibility toward ferromagnetic nanojunctions from a viewpoint of the Ni grain size and the Ni surface roughness. The grain size for Ni films of sub-10-nm thickness is ∼30 nm, which is larger than the Ni thickness, and the surface roughness, in the scanning scale of the film thickness, is less than 0.25 nm, corresponding to one-atomic-layer thickness. These experimental results indicate that spin quantum cross structures which consist of Ni thin films on PEN substrates can be expected as a candidate of ferromagnetic nanojunctions, which may lead to large magnetoresistance effect.
AB - We investigated surface morphologies of Ni thin films evaporated on polyethylene naphtalate (PEN) organic substrates for the fabrication of spin quantum cross structures and discussed its feasibility toward ferromagnetic nanojunctions from a viewpoint of the Ni grain size and the Ni surface roughness. The grain size for Ni films of sub-10-nm thickness is ∼30 nm, which is larger than the Ni thickness, and the surface roughness, in the scanning scale of the film thickness, is less than 0.25 nm, corresponding to one-atomic-layer thickness. These experimental results indicate that spin quantum cross structures which consist of Ni thin films on PEN substrates can be expected as a candidate of ferromagnetic nanojunctions, which may lead to large magnetoresistance effect.
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UR - http://www.scopus.com/inward/citedby.url?scp=46749107207&partnerID=8YFLogxK
U2 - 10.3131/jvsj2.51.211
DO - 10.3131/jvsj2.51.211
M3 - Article
VL - 51
SP - 211
EP - 213
JO - Journal of the Vacuum Society of Japan
JF - Journal of the Vacuum Society of Japan
SN - 1882-2398
IS - 3
ER -