TY - JOUR
T1 - Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy
AU - Satoh, Nobuo
AU - Yamaki, Michio
AU - Noda, Kei
AU - Katori, Shigetaka
AU - Kobayashi, Kei
AU - Matsushige, Kazumi
AU - Yamada, Hirofumi
N1 - Publisher Copyright:
© 2015 The Japan Society of Applied Physics.
PY - 2015/8/1
Y1 - 2015/8/1
N2 - We have investigated the organic semiconductor thin films deposited by vacuum evaporation deposition using intersecting metal shadow masks on indium tin oxide (ITO) electrode/glass substrates to simulate organic solar cells by simultaneous observation with dynamic force microscopy (DFM)/Kelvin-probe force microscopy (KFM). The energy band diagram was depicted by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM. We considered the charge behavior at the interface having band bending in the phenyl-C61-butyric acid methyl ester (PCBM) film.
AB - We have investigated the organic semiconductor thin films deposited by vacuum evaporation deposition using intersecting metal shadow masks on indium tin oxide (ITO) electrode/glass substrates to simulate organic solar cells by simultaneous observation with dynamic force microscopy (DFM)/Kelvin-probe force microscopy (KFM). The energy band diagram was depicted by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM. We considered the charge behavior at the interface having band bending in the phenyl-C61-butyric acid methyl ester (PCBM) film.
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U2 - 10.7567/JJAP.54.08KF06
DO - 10.7567/JJAP.54.08KF06
M3 - Article
AN - SCOPUS:84938514875
SN - 0021-4922
VL - 54
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
IS - 8
M1 - 08KF06
ER -