Surface potential measurement of fullerene derivative/copper phthalocyanine on indium tin oxide electrode by Kelvin probe force microscopy

Nobuo Satoh, Michio Yamaki, Kei Noda, Shigetaka Katori, Kei Kobayashi, Kazumi Matsushige, Hirofumi Yamada

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We have investigated the organic semiconductor thin films deposited by vacuum evaporation deposition using intersecting metal shadow masks on indium tin oxide (ITO) electrode/glass substrates to simulate organic solar cells by simultaneous observation with dynamic force microscopy (DFM)/Kelvin-probe force microscopy (KFM). The energy band diagram was depicted by simultaneously obtaining topographic and surface potential images of the same area using DFM/KFM. We considered the charge behavior at the interface having band bending in the phenyl-C61-butyric acid methyl ester (PCBM) film.

Original languageEnglish
Article number08KF06
JournalJapanese Journal of Applied Physics
Volume54
Issue number8
DOIs
Publication statusPublished - 2015 Aug 1
Externally publishedYes

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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