Surface relaxation of ZnO single crystal (0001) surface

Hideyuki Maki, Noboru Ichinose, Naoki Ohashi, Hajime Haneda, Junzo Tanaka

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Wurtzite-type ZnO is the polar crystal whose (0001) surface is terminated by Zn ions. The surface structure of ZnO single crystal was investigated by Atomic Force Microscope (AFM), Reflection High-Energy Electron Diffraction (RHEED) method and Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS). From AFM observations, the surface had a step/terrace structure and the step height was evaluated as a half of a lattice parameter. In order to remove impurities adsorbed on the surfaces, the samples were heated in an analysis chamber at 900°C for 3 hours under a pressure of 5×10-7 Pa with the irradiation of oxygen radical, and CAICISS and RHEED were observed. It was shown from RHEED patterns that the surface had (1 X 1) structure. From the polar angle dependence of CAICISS-TOF spectra for Zn ions, a peak due to the focusing effect for the 1st to 5th layer of Zn ions was observed at about 2° higher angle than a simulated angle. It could be concluded that the uppermost Zn ions were moved outside of the surface by 7% due to the relaxation.

Original languageEnglish
Pages (from-to)221-224
Number of pages4
JournalKey Engineering Materials
Issue number181-182
Publication statusPublished - 2000
Externally publishedYes

Fingerprint

Surface relaxation
Single crystal surfaces
Ions
Reflection high energy electron diffraction
Spectroscopy
Scattering
Microscopes
Surface structure
Diffraction patterns
Lattice constants
Reactive Oxygen Species
Irradiation
Single crystals
Impurities
Crystals
Oxygen

Keywords

  • Atomic Force Microscopy
  • Coaxial Impact-Collision Ion Scattering Spectroscopy
  • Reflection High Energy Electron Diffraction
  • Surface Relaxation
  • Zinc Oxide

ASJC Scopus subject areas

  • Ceramics and Composites
  • Chemical Engineering (miscellaneous)

Cite this

Maki, H., Ichinose, N., Ohashi, N., Haneda, H., & Tanaka, J. (2000). Surface relaxation of ZnO single crystal (0001) surface. Key Engineering Materials, (181-182), 221-224.

Surface relaxation of ZnO single crystal (0001) surface. / Maki, Hideyuki; Ichinose, Noboru; Ohashi, Naoki; Haneda, Hajime; Tanaka, Junzo.

In: Key Engineering Materials, No. 181-182, 2000, p. 221-224.

Research output: Contribution to journalArticle

Maki, H, Ichinose, N, Ohashi, N, Haneda, H & Tanaka, J 2000, 'Surface relaxation of ZnO single crystal (0001) surface', Key Engineering Materials, no. 181-182, pp. 221-224.
Maki H, Ichinose N, Ohashi N, Haneda H, Tanaka J. Surface relaxation of ZnO single crystal (0001) surface. Key Engineering Materials. 2000;(181-182):221-224.
Maki, Hideyuki ; Ichinose, Noboru ; Ohashi, Naoki ; Haneda, Hajime ; Tanaka, Junzo. / Surface relaxation of ZnO single crystal (0001) surface. In: Key Engineering Materials. 2000 ; No. 181-182. pp. 221-224.
@article{9a0293be9ce347889cea10627ac1fcc8,
title = "Surface relaxation of ZnO single crystal (0001) surface",
abstract = "Wurtzite-type ZnO is the polar crystal whose (0001) surface is terminated by Zn ions. The surface structure of ZnO single crystal was investigated by Atomic Force Microscope (AFM), Reflection High-Energy Electron Diffraction (RHEED) method and Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS). From AFM observations, the surface had a step/terrace structure and the step height was evaluated as a half of a lattice parameter. In order to remove impurities adsorbed on the surfaces, the samples were heated in an analysis chamber at 900°C for 3 hours under a pressure of 5×10-7 Pa with the irradiation of oxygen radical, and CAICISS and RHEED were observed. It was shown from RHEED patterns that the surface had (1 X 1) structure. From the polar angle dependence of CAICISS-TOF spectra for Zn ions, a peak due to the focusing effect for the 1st to 5th layer of Zn ions was observed at about 2° higher angle than a simulated angle. It could be concluded that the uppermost Zn ions were moved outside of the surface by 7{\%} due to the relaxation.",
keywords = "Atomic Force Microscopy, Coaxial Impact-Collision Ion Scattering Spectroscopy, Reflection High Energy Electron Diffraction, Surface Relaxation, Zinc Oxide",
author = "Hideyuki Maki and Noboru Ichinose and Naoki Ohashi and Hajime Haneda and Junzo Tanaka",
year = "2000",
language = "English",
pages = "221--224",
journal = "Key Engineering Materials",
issn = "1013-9826",
publisher = "Trans Tech Publications",
number = "181-182",

}

TY - JOUR

T1 - Surface relaxation of ZnO single crystal (0001) surface

AU - Maki, Hideyuki

AU - Ichinose, Noboru

AU - Ohashi, Naoki

AU - Haneda, Hajime

AU - Tanaka, Junzo

PY - 2000

Y1 - 2000

N2 - Wurtzite-type ZnO is the polar crystal whose (0001) surface is terminated by Zn ions. The surface structure of ZnO single crystal was investigated by Atomic Force Microscope (AFM), Reflection High-Energy Electron Diffraction (RHEED) method and Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS). From AFM observations, the surface had a step/terrace structure and the step height was evaluated as a half of a lattice parameter. In order to remove impurities adsorbed on the surfaces, the samples were heated in an analysis chamber at 900°C for 3 hours under a pressure of 5×10-7 Pa with the irradiation of oxygen radical, and CAICISS and RHEED were observed. It was shown from RHEED patterns that the surface had (1 X 1) structure. From the polar angle dependence of CAICISS-TOF spectra for Zn ions, a peak due to the focusing effect for the 1st to 5th layer of Zn ions was observed at about 2° higher angle than a simulated angle. It could be concluded that the uppermost Zn ions were moved outside of the surface by 7% due to the relaxation.

AB - Wurtzite-type ZnO is the polar crystal whose (0001) surface is terminated by Zn ions. The surface structure of ZnO single crystal was investigated by Atomic Force Microscope (AFM), Reflection High-Energy Electron Diffraction (RHEED) method and Coaxial Impact-Collision Ion Scattering Spectroscopy (CAICISS). From AFM observations, the surface had a step/terrace structure and the step height was evaluated as a half of a lattice parameter. In order to remove impurities adsorbed on the surfaces, the samples were heated in an analysis chamber at 900°C for 3 hours under a pressure of 5×10-7 Pa with the irradiation of oxygen radical, and CAICISS and RHEED were observed. It was shown from RHEED patterns that the surface had (1 X 1) structure. From the polar angle dependence of CAICISS-TOF spectra for Zn ions, a peak due to the focusing effect for the 1st to 5th layer of Zn ions was observed at about 2° higher angle than a simulated angle. It could be concluded that the uppermost Zn ions were moved outside of the surface by 7% due to the relaxation.

KW - Atomic Force Microscopy

KW - Coaxial Impact-Collision Ion Scattering Spectroscopy

KW - Reflection High Energy Electron Diffraction

KW - Surface Relaxation

KW - Zinc Oxide

UR - http://www.scopus.com/inward/record.url?scp=0033717653&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033717653&partnerID=8YFLogxK

M3 - Article

SP - 221

EP - 224

JO - Key Engineering Materials

JF - Key Engineering Materials

SN - 1013-9826

IS - 181-182

ER -