Switching region analysis for SOTB technology

Carlos Cortes, Hideharu Amano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

IoT (Internet of Things) devices tend to work intermittently, and the leakage power reduction in the sleeping state is essential. Although giving the reverse body bias to the back gate of transistors is an efficient technique to reduce the leakage power, it has not been commonly used dynamically because of the large timing overhead when a common CMOS process is used. However, recent SOI technologies enabled to use dynamic body bias control with an acceptable overhead. Here, we focus on Silicon On Thin Box (SOTB), a type of SOI technology which can control body biasing widely with a small overhead. For the dynamic body bias control, we analyzed timing overhead of a simple microcontroller and dynamically reconfigurable processor with SOTB technology. Evaluation results revealed that the sleep down time and the wake-up time are about hundreds microseconds both for the processor core, memory module, and smaller elements. We could not observe a certain relationship between the area of target modules and the timing overhead.

Original languageEnglish
Title of host publication2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages33-36
Number of pages4
ISBN (Electronic)9781538619629
DOIs
Publication statusPublished - 2017 Jun 27
Event10th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017 - Quintana Roo, Cozumel, Mexico
Duration: 2017 Jun 52017 Jun 7

Other

Other10th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017
CountryMexico
CityQuintana Roo, Cozumel
Period17/6/517/6/7

Fingerprint

Silicon
Microcontrollers
Transistors
Data storage equipment
Sleep
Internet of things

Keywords

  • Dynamic Body Bias control
  • Silicon On Thin Box
  • Timing overhead evaluation

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Hardware and Architecture
  • Electrical and Electronic Engineering

Cite this

Cortes, C., & Amano, H. (2017). Switching region analysis for SOTB technology. In 2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017 (pp. 33-36). [7959717] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ICCDCS.2017.7959717

Switching region analysis for SOTB technology. / Cortes, Carlos; Amano, Hideharu.

2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 33-36 7959717.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Cortes, C & Amano, H 2017, Switching region analysis for SOTB technology. in 2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017., 7959717, Institute of Electrical and Electronics Engineers Inc., pp. 33-36, 10th International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017, Quintana Roo, Cozumel, Mexico, 17/6/5. https://doi.org/10.1109/ICCDCS.2017.7959717
Cortes C, Amano H. Switching region analysis for SOTB technology. In 2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 33-36. 7959717 https://doi.org/10.1109/ICCDCS.2017.7959717
Cortes, Carlos ; Amano, Hideharu. / Switching region analysis for SOTB technology. 2017 International Caribbean Conference on Devices, Circuits and Systems, ICCDCS 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 33-36
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