TCI Tester: Tester for through Chip Interface

Hideto Kayashima, Hideharu Amano

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the 26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages103-104
Number of pages2
ISBN (Electronic)9781450379991
DOIs
Publication statusPublished - 2021 Jan 18
Event26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021 - Virtual, Online, Japan
Duration: 2021 Jan 182021 Jan 21

Publication series

NameProceedings of the Asia and South Pacific Design Automation Conference, ASP-DAC

Conference

Conference26th Asia and South Pacific Design Automation Conference, ASP-DAC 2021
CountryJapan
CityVirtual, Online
Period21/1/1821/1/21

Keywords

  • Wireless inter-chip communicaton, TCI

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Computer Graphics and Computer-Aided Design

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