Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures

Hiroyasu Nakayama; Hongyu An; Akiyo Nomura; Yusuke Kanno; Satoshi Haku; Yusaku Kuwahara; Hiroto Sakimura; Kazuya Ando

doi:10.1063/1.4984281

Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures

Hiroyasu Nakayama, Hongyu An, Akiyo Nomura, Yusuke Kanno, Satoshi Haku, Yusaku Kuwahara, Hiroto Sakimura, Kazuya Ando

Department of Applied Physics and Physico-Informatics

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

We have investigated the recently discovered Rashba-Edelstein magnetoresistance (REMR) in Bi/Ag/CoFeB trilayer structures with different temperatures, Bi thicknesses, and magnetic fields via the angular-dependent magnetoresistance (ADMR) measurements. We found that the magnitude of the REMR shows a small variation with changing temperature, which is consistent with the previous work on the temperature evolution of the inverse Rashba-Edelstein effect. Furthermore, the ADMR measurements with different thicknesses of Bi layers and external magnetic fields revealed that the contribution from the field-dependent magnetoresistance is not negligibly small for thicker Bi films (≥10 nm) at low temperature.

Original language	English
Article number	222406
Journal	Applied Physics Letters
Volume	110
Issue number	22
DOIs	https://doi.org/10.1063/1.4984281
Publication status	Published - 2017 May 29

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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title = "Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures",

abstract = "We have investigated the recently discovered Rashba-Edelstein magnetoresistance (REMR) in Bi/Ag/CoFeB trilayer structures with different temperatures, Bi thicknesses, and magnetic fields via the angular-dependent magnetoresistance (ADMR) measurements. We found that the magnitude of the REMR shows a small variation with changing temperature, which is consistent with the previous work on the temperature evolution of the inverse Rashba-Edelstein effect. Furthermore, the ADMR measurements with different thicknesses of Bi layers and external magnetic fields revealed that the contribution from the field-dependent magnetoresistance is not negligibly small for thicker Bi films (≥10 nm) at low temperature.",

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T1 - Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures

AU - Nakayama, Hiroyasu

AU - An, Hongyu

AU - Nomura, Akiyo

AU - Kanno, Yusuke

AU - Haku, Satoshi

AU - Kuwahara, Yusaku

AU - Sakimura, Hiroto

AU - Ando, Kazuya

PY - 2017/5/29

Y1 - 2017/5/29

N2 - We have investigated the recently discovered Rashba-Edelstein magnetoresistance (REMR) in Bi/Ag/CoFeB trilayer structures with different temperatures, Bi thicknesses, and magnetic fields via the angular-dependent magnetoresistance (ADMR) measurements. We found that the magnitude of the REMR shows a small variation with changing temperature, which is consistent with the previous work on the temperature evolution of the inverse Rashba-Edelstein effect. Furthermore, the ADMR measurements with different thicknesses of Bi layers and external magnetic fields revealed that the contribution from the field-dependent magnetoresistance is not negligibly small for thicker Bi films (≥10 nm) at low temperature.

AB - We have investigated the recently discovered Rashba-Edelstein magnetoresistance (REMR) in Bi/Ag/CoFeB trilayer structures with different temperatures, Bi thicknesses, and magnetic fields via the angular-dependent magnetoresistance (ADMR) measurements. We found that the magnitude of the REMR shows a small variation with changing temperature, which is consistent with the previous work on the temperature evolution of the inverse Rashba-Edelstein effect. Furthermore, the ADMR measurements with different thicknesses of Bi layers and external magnetic fields revealed that the contribution from the field-dependent magnetoresistance is not negligibly small for thicker Bi films (≥10 nm) at low temperature.

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Temperature dependence of Rashba-Edelstein magnetoresistance in Bi/Ag/CoFeB trilayer structures

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