Temperature dependence of the delayed fluorescence lifetime in anthracene crystals with triplet exciton traps

Kohei Yokoi, Yujiro Ohba

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The lifetime of delayed fluorescence of anthracene crystals excited by the chopped-light of a He-Ne laser is investigated as a function of temperature over the range 110480 K. As compared with the fluorescence intensity, the lifetime is not influenced much by the temperature dependence of triplet-triplet annihilation rate and singlet-triplet absorption coefficient. Considering a trap saturation effect, an analysis has been made of the temperature dependence of the lifetime. In defect-induced crystals, three kinds of defects are observed by X-ray irradiation. Two are 0.33 and 0.16 eV in triplet trap depth, and the trapped triplet decay rate is 5×106 s−1 for both; the other is 0.29 eV and 1 s−1. The latter is of a different type from the former, namely, it is almost a pure trapping center which hardly quenches triplet excitons.

Original languageEnglish
Pages (from-to)1655-1662
Number of pages8
JournalJapanese Journal of Applied Physics
Volume19
Issue number9
DOIs
Publication statusPublished - 1980

Fingerprint

Anthracene
anthracene
Excitons
Fluorescence
excitons
traps
life (durability)
fluorescence
temperature dependence
Crystals
crystals
Defects
defects
Temperature
decay rates
absorptivity
trapping
Irradiation
saturation
X rays

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

Cite this

Temperature dependence of the delayed fluorescence lifetime in anthracene crystals with triplet exciton traps. / Yokoi, Kohei; Ohba, Yujiro.

In: Japanese Journal of Applied Physics, Vol. 19, No. 9, 1980, p. 1655-1662.

Research output: Contribution to journalArticle

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