Abstract
The lifetime of delayed fluorescence of anthracene crystals excited by the chopped-light of a He-Ne laser is investigated as a function of temperature over the range 110480 K. As compared with the fluorescence intensity, the lifetime is not influenced much by the temperature dependence of triplet-triplet annihilation rate and singlet-triplet absorption coefficient. Considering a trap saturation effect, an analysis has been made of the temperature dependence of the lifetime. In defect-induced crystals, three kinds of defects are observed by X-ray irradiation. Two are 0.33 and 0.16 eV in triplet trap depth, and the trapped triplet decay rate is 5×106 s−1 for both; the other is 0.29 eV and 1 s−1. The latter is of a different type from the former, namely, it is almost a pure trapping center which hardly quenches triplet excitons.
| Original language | English |
|---|---|
| Pages (from-to) | 1655-1662 |
| Number of pages | 8 |
| Journal | Japanese Journal of Applied Physics |
| Volume | 19 |
| Issue number | 9 |
| DOIs | |
| Publication status | Published - 1980 |
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ASJC Scopus subject areas
- Engineering(all)
- Physics and Astronomy(all)
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Temperature dependence of the delayed fluorescence lifetime in anthracene crystals with triplet exciton traps. / Yokoi, Kohei; Ohba, Yujiro.
In: Japanese Journal of Applied Physics, Vol. 19, No. 9, 1980, p. 1655-1662.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Temperature dependence of the delayed fluorescence lifetime in anthracene crystals with triplet exciton traps
AU - Yokoi, Kohei
AU - Ohba, Yujiro
PY - 1980
Y1 - 1980
N2 - The lifetime of delayed fluorescence of anthracene crystals excited by the chopped-light of a He-Ne laser is investigated as a function of temperature over the range 110480 K. As compared with the fluorescence intensity, the lifetime is not influenced much by the temperature dependence of triplet-triplet annihilation rate and singlet-triplet absorption coefficient. Considering a trap saturation effect, an analysis has been made of the temperature dependence of the lifetime. In defect-induced crystals, three kinds of defects are observed by X-ray irradiation. Two are 0.33 and 0.16 eV in triplet trap depth, and the trapped triplet decay rate is 5×106 s−1 for both; the other is 0.29 eV and 1 s−1. The latter is of a different type from the former, namely, it is almost a pure trapping center which hardly quenches triplet excitons.
AB - The lifetime of delayed fluorescence of anthracene crystals excited by the chopped-light of a He-Ne laser is investigated as a function of temperature over the range 110480 K. As compared with the fluorescence intensity, the lifetime is not influenced much by the temperature dependence of triplet-triplet annihilation rate and singlet-triplet absorption coefficient. Considering a trap saturation effect, an analysis has been made of the temperature dependence of the lifetime. In defect-induced crystals, three kinds of defects are observed by X-ray irradiation. Two are 0.33 and 0.16 eV in triplet trap depth, and the trapped triplet decay rate is 5×106 s−1 for both; the other is 0.29 eV and 1 s−1. The latter is of a different type from the former, namely, it is almost a pure trapping center which hardly quenches triplet excitons.
UR - http://www.scopus.com/inward/record.url?scp=84873666003&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84873666003&partnerID=8YFLogxK
U2 - 10.1143/JJAP.19.1655
DO - 10.1143/JJAP.19.1655
M3 - Article
AN - SCOPUS:84873666003
VL - 19
SP - 1655
EP - 1662
JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes
SN - 0021-4922
IS - 9
ER -