Terahertz generation measurements of multilayered GeTe–Sb 2 Te 3 phase change materials

Kotaro Makino, Kosaku Kato, Yuta Saito, Paul Fons, Alexander V. Kolobov, Junji Tominaga, Takashi Nakano, Makoto Nakajima

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

Multilayered structures of GeTe and Sb 2 Te 3 phase change material, also referred to as interfacial phase change memory (iPCM), provide superior performance for nonvolatile electrical memory technology in which the atomically controlled structure plays an important role in memory operation. Here, we report on terahertz (THz) wave generation measurements. Three- and 20-layer iPCM samples were irradiated with a femtosecond laser, and the generated THz radiation was observed. The emitted THz pulse was found to be always p polarized independent of the polarization of the excitation pulse. Based on the polarization dependence as well as the flip of the THz field from photoexcited Sb 2 Te 3 and Bi 2 Te 3 , the THz emission process can be attributed to the surge current flow due to the built-in surface depletion layer formed in p-type semiconducting iPCM materials.

Original languageEnglish
Pages (from-to)1355-1358
Number of pages4
JournalOptics Letters
Volume44
Issue number6
DOIs
Publication statusPublished - 2019 Jan 1
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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