Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu, Shinichi Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We experimentally show that continuously changing polarity of an elliptically-polarized terahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ∼1 μm.

Original languageEnglish
Title of host publication2012 Conference on Lasers and Electro-Optics, CLEO 2012
Publication statusPublished - 2012 Dec 6
Event2012 Conference on Lasers and Electro-Optics, CLEO 2012 - San Jose, CA, United States
Duration: 2012 May 62012 May 11

Publication series

Name2012 Conference on Lasers and Electro-Optics, CLEO 2012

Other

Other2012 Conference on Lasers and Electro-Optics, CLEO 2012
CountryUnited States
CitySan Jose, CA
Period12/5/612/5/11

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Terahertz profilometer by time-domain polarimetry'. Together they form a unique fingerprint.

  • Cite this

    Yasumatsu, N., & Watanabe, S. (2012). Terahertz profilometer by time-domain polarimetry. In 2012 Conference on Lasers and Electro-Optics, CLEO 2012 [6326108] (2012 Conference on Lasers and Electro-Optics, CLEO 2012).