Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu, Shinichi Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

We experimentally show that continuously changing polarity of an elliptically-polarized terahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ∼1 μm.

Original languageEnglish
Title of host publication2012 Conference on Lasers and Electro-Optics, CLEO 2012
Publication statusPublished - 2012
Event2012 Conference on Lasers and Electro-Optics, CLEO 2012 - San Jose, CA, United States
Duration: 2012 May 62012 May 11

Other

Other2012 Conference on Lasers and Electro-Optics, CLEO 2012
CountryUnited States
CitySan Jose, CA
Period12/5/612/5/11

Fingerprint

Polarimeters
Metals
Electric fields
Semiconductor materials

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Yasumatsu, N., & Watanabe, S. (2012). Terahertz profilometer by time-domain polarimetry. In 2012 Conference on Lasers and Electro-Optics, CLEO 2012 [6326108]

Terahertz profilometer by time-domain polarimetry. / Yasumatsu, Naoya; Watanabe, Shinichi.

2012 Conference on Lasers and Electro-Optics, CLEO 2012. 2012. 6326108.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Yasumatsu, N & Watanabe, S 2012, Terahertz profilometer by time-domain polarimetry. in 2012 Conference on Lasers and Electro-Optics, CLEO 2012., 6326108, 2012 Conference on Lasers and Electro-Optics, CLEO 2012, San Jose, CA, United States, 12/5/6.
Yasumatsu N, Watanabe S. Terahertz profilometer by time-domain polarimetry. In 2012 Conference on Lasers and Electro-Optics, CLEO 2012. 2012. 6326108
Yasumatsu, Naoya ; Watanabe, Shinichi. / Terahertz profilometer by time-domain polarimetry. 2012 Conference on Lasers and Electro-Optics, CLEO 2012. 2012.
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