Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu, Shinichi Watanabe

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2012
PublisherOptical Society of America (OSA)
PagesCTu3B.7
ISBN (Print)9781557529435
DOIs
Publication statusPublished - 2012
EventCLEO: Science and Innovations, CLEO_SI 2012 - San Jose, CA, United States
Duration: 2012 May 62012 May 11

Publication series

NameCLEO: Science and Innovations, CLEO_SI 2012

Other

OtherCLEO: Science and Innovations, CLEO_SI 2012
CountryUnited States
CitySan Jose, CA
Period12/5/612/5/11

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Fingerprint Dive into the research topics of 'Terahertz profilometer by time-domain polarimetry'. Together they form a unique fingerprint.

  • Cite this

    Yasumatsu, N., & Watanabe, S. (2012). Terahertz profilometer by time-domain polarimetry. In CLEO: Science and Innovations, CLEO_SI 2012 (pp. CTu3B.7). (CLEO: Science and Innovations, CLEO_SI 2012). Optical Society of America (OSA). https://doi.org/10.1364/cleo_si.2012.ctu3b.7