TY - GEN
T1 - Terahertz profilometer by time-domain polarimetry
AU - Yasumatsu, Naoya
AU - Watanabe, Shinichi
PY - 2012
Y1 - 2012
N2 - We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.
AB - We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.
UR - http://www.scopus.com/inward/record.url?scp=84890712452&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84890712452&partnerID=8YFLogxK
U2 - 10.1364/cleo_si.2012.ctu3b.7
DO - 10.1364/cleo_si.2012.ctu3b.7
M3 - Conference contribution
AN - SCOPUS:84890712452
SN - 9781557529435
T3 - CLEO: Science and Innovations, CLEO_SI 2012
SP - CTu3B.7
BT - CLEO
PB - Optical Society of America (OSA)
T2 - CLEO: Science and Innovations, CLEO_SI 2012
Y2 - 6 May 2012 through 11 May 2012
ER -