Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu; Shinichi Watanabe

doi:10.1364/cleo_si.2012.ctu3b.7

Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu, Shinichi Watanabe

Department of Physics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.

Original language	English
Title of host publication	CLEO
Subtitle of host publication	Science and Innovations, CLEO_SI 2012
Publisher	Optical Society of America (OSA)
Pages	CTu3B.7
ISBN (Print)	9781557529435
DOIs	https://doi.org/10.1364/cleo_si.2012.ctu3b.7
Publication status	Published - 2012
Event	CLEO: Science and Innovations, CLEO_SI 2012 - San Jose, CA, United States Duration: 2012 May 6 → 2012 May 11

Publication series

Name	CLEO: Science and Innovations, CLEO_SI 2012

Other

Other	CLEO: Science and Innovations, CLEO_SI 2012
Country/Territory	United States
City	San Jose, CA
Period	12/5/6 → 12/5/11

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials

Access to Document

10.1364/cleo_si.2012.ctu3b.7

Cite this

@inproceedings{0e99fe350be24b7c8d34b8f89ce86f68,

title = "Terahertz profilometer by time-domain polarimetry",

abstract = "We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of{\~ }1 μm.",

author = "Naoya Yasumatsu and Shinichi Watanabe",

year = "2012",

doi = "10.1364/cleo_si.2012.ctu3b.7",

language = "English",

isbn = "9781557529435",

series = "CLEO: Science and Innovations, CLEO_SI 2012",

publisher = "Optical Society of America (OSA)",

pages = "CTu3B.7",

booktitle = "CLEO",

note = "CLEO: Science and Innovations, CLEO_SI 2012 ; Conference date: 06-05-2012 Through 11-05-2012",

}

TY - GEN

T1 - Terahertz profilometer by time-domain polarimetry

AU - Yasumatsu, Naoya

AU - Watanabe, Shinichi

PY - 2012

Y1 - 2012

N2 - We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.

AB - We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.

UR - http://www.scopus.com/inward/record.url?scp=84890712452&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84890712452&partnerID=8YFLogxK

U2 - 10.1364/cleo_si.2012.ctu3b.7

DO - 10.1364/cleo_si.2012.ctu3b.7

M3 - Conference contribution

AN - SCOPUS:84890712452

SN - 9781557529435

T3 - CLEO: Science and Innovations, CLEO_SI 2012

SP - CTu3B.7

BT - CLEO

PB - Optical Society of America (OSA)

T2 - CLEO: Science and Innovations, CLEO_SI 2012

Y2 - 6 May 2012 through 11 May 2012

ER -

Terahertz profilometer by time-domain polarimetry

Abstract

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ASJC Scopus subject areas

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