Terahertz profilometer by time-domain polarimetry

Naoya Yasumatsu, Shinichi Watanabe

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

We experimentally show that continuously changing polarity of an ellipticallypolarizedterahertz electric-field can be used to image a height profile of semiconductors, metals, and their hybrid samples with a depth resolution of ̃1 μm.

Original languageEnglish
Title of host publicationCLEO
Subtitle of host publicationScience and Innovations, CLEO_SI 2012
PublisherOptical Society of America (OSA)
PagesCTu3B.7
ISBN (Print)9781557529435
DOIs
Publication statusPublished - 2012
EventCLEO: Science and Innovations, CLEO_SI 2012 - San Jose, CA, United States
Duration: 2012 May 6 → 2012 May 11

Publication series

NameCLEO: Science and Innovations, CLEO_SI 2012

Other

OtherCLEO: Science and Innovations, CLEO_SI 2012
CountryUnited States
CitySan Jose, CA
Period12/5/6 → 12/5/11

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

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