Abstract
GeTe is a narrow band gap semiconductor that undergoes a ferroelectric-to-paraelectric phase transition at ∼705 K. While earlier studies of average structure using Bragg diffraction concluded that the transition was displacive, structural probing of short and intermediate order shows evidence for an order-disorder transition. Here, we report and contrast the structure on different length scales with temperature using a radial distribution function analysis obtained from x-ray based total scattering and show that the order-disorder model is consistent with experiment.
Original language | English |
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Article number | 231907 |
Journal | Applied Physics Letters |
Volume | 99 |
Issue number | 23 |
DOIs | |
Publication status | Published - 2011 Dec 5 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)