Theory of X-ray diffraction imaging

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

X-ray diffraction imaging (XDI) is a technique for visualizing the structures of non-crystalline particles with dimensions ranging from micrometers to submicrometers. In XDI experiments, non-crystalline particles are irradiated by X-rays with high transverse coherence. Then, the Fraunhofer diffraction pattern is recorded under the oversampling condition at a desired resolution. The electron density map of the particle projected along the direction of the incident X-ray is reconstructed by applying the phase-retrieval (PR) algorithm to the diffraction pattern alone. In this chapter, the spatial coherence of X-rays, the X-ray source necessary for XDI, and the representative algorithms used for PR are introduced.

Original languageEnglish
Title of host publicationSpringer Series in Optical Sciences
PublisherSpringer Verlag
Pages49-74
Number of pages26
DOIs
Publication statusPublished - 2018 Jan 1

Publication series

NameSpringer Series in Optical Sciences
Volume210
ISSN (Print)0342-4111
ISSN (Electronic)1556-1534

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ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Nakasako, M. (2018). Theory of X-ray diffraction imaging. In Springer Series in Optical Sciences (pp. 49-74). (Springer Series in Optical Sciences; Vol. 210). Springer Verlag. https://doi.org/10.1007/978-4-431-56618-2_3