Thermal conductivity measurements of Sb-Te alloy thin films using a nanosecond thermoreflectance measurement system

Masashi Kuwahara, Osamu Suzuki, Naoyuki Taketoshi, Takashi Yagi, Paul Fons, Junji Tominaga, Tetsuya Baba

Research output: Contribution to journalArticle

19 Citations (Scopus)

Abstract

Using a nanosecond thermoreflectance measurement system, which enables the measurement of the thermal conductivity of nanometer-scale thin films, we have measured the thermal conductivities of Sb2Te, Sb2 Te 3, SbTeo, Sb, and Te thin films at room temperature. We clarified that the thermal conductivities of Sb-Te alloys depend on the Sb and Te atomic ratios. A large change in thermal conductivity was observed in the vicinity of the composition ratio of Sb2Te3. We proposed that this large change may be attributable to the formation of an Sb atomic network in the crystalline structure of the Sb-Te alloy.

Original languageEnglish
Pages (from-to)6863-6864
Number of pages2
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume46
Issue number10 A
DOIs
Publication statusPublished - 2007 Oct 9
Externally publishedYes

Keywords

  • Optical disks
  • Phase-change memory
  • Sb-Te alloys
  • Thermal conductivity
  • Thermoreflectance

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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