Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars

M. Zhang, Y. Nozaki, K. Matsuyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG ASIA 2005
Subtitle of host publicationDigests of the IEEE International Magnetics Conference
PublisherIEEE Computer Society
Pages1743-1744
Number of pages2
ISBN (Print)0780390091, 9780780390096
DOIs
Publication statusPublished - 2005
EventINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan
Duration: 2005 Apr 42005 Apr 8

Publication series

NameINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference

Other

OtherINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
CountryJapan
CityNagoya
Period05/4/405/4/8

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Zhang, M., Nozaki, Y., & Matsuyama, K. (2005). Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 1743-1744). [GS 01] (INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference). IEEE Computer Society. https://doi.org/10.1109/intmag.2005.1464305