Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars

M. Zhang, Yukio Nozaki, K. Matsuyama

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
Pages872
Number of pages1
Publication statusPublished - 2005
Externally publishedYes
EventINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference - Nagoya, Japan
Duration: 2005 Apr 42005 Apr 8

Other

OtherINTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference
CountryJapan
CityNagoya
Period05/4/405/4/8

ASJC Scopus subject areas

  • Engineering(all)

Cite this

Zhang, M., Nozaki, Y., & Matsuyama, K. (2005). Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference (pp. 872)

Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. / Zhang, M.; Nozaki, Yukio; Matsuyama, K.

INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. p. 872.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Zhang, M, Nozaki, Y & Matsuyama, K 2005, Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. in INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. pp. 872, INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference, Nagoya, Japan, 05/4/4.
Zhang M, Nozaki Y, Matsuyama K. Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. In INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. p. 872
Zhang, M. ; Nozaki, Yukio ; Matsuyama, K. / Thickness dependence of interlayer fringe field coupling in sub micron NiFe/Cu multilayered pillars. INTERMAG ASIA 2005: Digests of the IEEE International Magnetics Conference. 2005. pp. 872
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