Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

H. Toda, E. Maire, Y. Aoki, M. Kobayashi

    Research output: Contribution to journalArticle

    23 Citations (Scopus)

    Abstract

    Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

    Original languageEnglish
    Pages (from-to)549-561
    Number of pages13
    JournalJournal of Strain Analysis for Engineering Design
    Volume46
    Issue number7
    DOIs
    Publication statusPublished - 2011 Oct 1

    Keywords

    • 3D
    • Computed tomography
    • Digital volume correlation
    • Local strain mapping
    • Microstructural tracking

    ASJC Scopus subject areas

    • Modelling and Simulation
    • Mechanics of Materials
    • Mechanical Engineering
    • Applied Mathematics

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