Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

H. Toda, E. Maire, Yoshimitsu Aoki, M. Kobayashi

Research output: Contribution to journalArticle

21 Citations (Scopus)

Abstract

Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

Original languageEnglish
Pages (from-to)549-561
Number of pages13
JournalJournal of Strain Analysis for Engineering Design
Volume46
Issue number7
DOIs
Publication statusPublished - 2011 Oct

Fingerprint

Microtomography
Synchrotrons
X rays
Three-dimensional
Image resolution
Synchrotron radiation
Optical microscopy
Synchrotron Radiation
Microscopy
Three-dimension
Interior
High Resolution
Processing
Methodology

Keywords

  • 3D
  • Computed tomography
  • Digital volume correlation
  • Local strain mapping
  • Microstructural tracking

ASJC Scopus subject areas

  • Mechanical Engineering
  • Mechanics of Materials
  • Applied Mathematics
  • Modelling and Simulation

Cite this

Three-dimensional strain mapping using in situ X-ray synchrotron microtomography. / Toda, H.; Maire, E.; Aoki, Yoshimitsu; Kobayashi, M.

In: Journal of Strain Analysis for Engineering Design, Vol. 46, No. 7, 10.2011, p. 549-561.

Research output: Contribution to journalArticle

@article{4a02a90e77f5404b84d18e90befe9fb2,
title = "Three-dimensional strain mapping using in situ X-ray synchrotron microtomography",
abstract = "Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.",
keywords = "3D, Computed tomography, Digital volume correlation, Local strain mapping, Microstructural tracking",
author = "H. Toda and E. Maire and Yoshimitsu Aoki and M. Kobayashi",
year = "2011",
month = "10",
doi = "10.1177/0309324711408975",
language = "English",
volume = "46",
pages = "549--561",
journal = "Journal of Strain Analysis for Engineering Design",
issn = "0309-3247",
publisher = "SAGE Publications Ltd",
number = "7",

}

TY - JOUR

T1 - Three-dimensional strain mapping using in situ X-ray synchrotron microtomography

AU - Toda, H.

AU - Maire, E.

AU - Aoki, Yoshimitsu

AU - Kobayashi, M.

PY - 2011/10

Y1 - 2011/10

N2 - Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

AB - Recent advances in X-ray microtomography have created the opportunity to image the interior of materials. Microstructural images that are similar to or about an order of magnitude higher in resolution than those currently obtained with light microscopy can now be obtained in three-dimensions using synchrotron radiation. Local strain mapping is readily enabled by processing these high-resolution tomographic images using either the microstructural tracking technique or the digital volume correlation technique. This article is a review of the methodology behind these techniques and discusses recent experimental research on three-dimensional (3D) strain mapping. Potential future research directions are also outlined.

KW - 3D

KW - Computed tomography

KW - Digital volume correlation

KW - Local strain mapping

KW - Microstructural tracking

UR - http://www.scopus.com/inward/record.url?scp=81455134440&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=81455134440&partnerID=8YFLogxK

U2 - 10.1177/0309324711408975

DO - 10.1177/0309324711408975

M3 - Article

AN - SCOPUS:81455134440

VL - 46

SP - 549

EP - 561

JO - Journal of Strain Analysis for Engineering Design

JF - Journal of Strain Analysis for Engineering Design

SN - 0309-3247

IS - 7

ER -