Three-dimensional structural analyses in cryogenic X-ray diffraction imaging

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

An electron density map projected along the direction of the incident X-ray is obtained from a single small-angle diffraction pattern. However, most projection maps are difficult to interpret. The final goal of a structural analysis is a visualization of the electron density distribution in three dimensions. In this chapter, the tomography X-ray diffraction imaging (XDI) method is first introduced to visualize three-dimensional (3D) electron density maps of particles in XDI using synchrotron radiation. In XDI experiments using X-ray free electron laser (XFEL) pulses, as the specimen particles are destroyed by single X-ray pulses, tomography experiments are impossible. Under the assumption that the structures of the particles are similar at a low resolution, 3D reconstruction is possible by utilizing the single particle analysis method developed in transmission electron microscopy (TEM). A scheme for 3D reconstruction in XFEL-XDI through simulations for macromolecules and experiments on a cellular organelle is proposed.

Original languageEnglish
Title of host publicationSpringer Series in Optical Sciences
PublisherSpringer Verlag
Pages181-212
Number of pages32
DOIs
Publication statusPublished - 2018 Jan 1

Publication series

NameSpringer Series in Optical Sciences
Volume210
ISSN (Print)0342-4111
ISSN (Electronic)1556-1534

Fingerprint

Cryogenics
X ray lasers
Imaging techniques
X ray diffraction
Free electron lasers
Tomography
Carrier concentration
X rays
Electronic density of states
Experiments
Synchrotron radiation
Macromolecules
Structural analysis
Diffraction patterns
Laser pulses
Visualization
Transmission electron microscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Nakasako, M. (2018). Three-dimensional structural analyses in cryogenic X-ray diffraction imaging. In Springer Series in Optical Sciences (pp. 181-212). (Springer Series in Optical Sciences; Vol. 210). Springer Verlag. https://doi.org/10.1007/978-4-431-56618-2_9

Three-dimensional structural analyses in cryogenic X-ray diffraction imaging. / Nakasako, Masayoshi.

Springer Series in Optical Sciences. Springer Verlag, 2018. p. 181-212 (Springer Series in Optical Sciences; Vol. 210).

Research output: Chapter in Book/Report/Conference proceedingChapter

Nakasako, M 2018, Three-dimensional structural analyses in cryogenic X-ray diffraction imaging. in Springer Series in Optical Sciences. Springer Series in Optical Sciences, vol. 210, Springer Verlag, pp. 181-212. https://doi.org/10.1007/978-4-431-56618-2_9
Nakasako M. Three-dimensional structural analyses in cryogenic X-ray diffraction imaging. In Springer Series in Optical Sciences. Springer Verlag. 2018. p. 181-212. (Springer Series in Optical Sciences). https://doi.org/10.1007/978-4-431-56618-2_9
Nakasako, Masayoshi. / Three-dimensional structural analyses in cryogenic X-ray diffraction imaging. Springer Series in Optical Sciences. Springer Verlag, 2018. pp. 181-212 (Springer Series in Optical Sciences).
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