Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi, Yuko Inatomi, Tomohiro Tanaka, Naoto Shinozaki, Masahito Watanabe, Akira Fujimoto, Kohei M Itoh

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope 73Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

Original languageEnglish
Pages (from-to)5274-5276
Number of pages3
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume45
Issue number6 A
DOIs
Publication statusPublished - 2006

Fingerprint

Isotopes
Mass spectrometry
mass spectroscopy
diffusion coefficient
isotopes
Chemical analysis
Radioactive tracers
isotope ratios
Magnetohydrodynamics
Secondary ion mass spectrometry
free convection
magnetohydrodynamics
secondary ion mass spectrometry
tracers
convection
Magnetic fields
magnetic fields
Convection
Hot Temperature

Keywords

  • Convection
  • Germanium
  • Isotope
  • Self-diffusion coefficient
  • Static magnetic field
  • Time-of-flight secondary mass spectrometry

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. / Onishi, Fumitomo; Inatomi, Yuko; Tanaka, Tomohiro; Shinozaki, Naoto; Watanabe, Masahito; Fujimoto, Akira; Itoh, Kohei M.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 45, No. 6 A, 2006, p. 5274-5276.

Research output: Contribution to journalArticle

Onishi, Fumitomo ; Inatomi, Yuko ; Tanaka, Tomohiro ; Shinozaki, Naoto ; Watanabe, Masahito ; Fujimoto, Akira ; Itoh, Kohei M. / Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 2006 ; Vol. 45, No. 6 A. pp. 5274-5276.
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AU - Fujimoto, Akira

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