Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi; Yuko Inatomi; Tomohiro Tanaka; Naoto Shinozaki; Masahito Watanabe; Akira Fujimoto; Kouhei Itoh

doi:10.1143/JJAP.45.5274

Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient

Fumitomo Onishi, Yuko Inatomi, Tomohiro Tanaka, Naoto Shinozaki, Masahito Watanabe, Akira Fujimoto, Kouhei Itoh

Department of Applied Physics and Physico-Informatics

Research output: Contribution to journal › Article

5 Citations (Scopus)

Abstract

The analysis of isotope ratio in a material consisting of a single element was developed as a fundamental technique to determine a self-diffusion coefficient in a melt based on time-of-flight secondary mass spectrometry (TOF-SIMS). The self-diffusion coefficient for a pure Ge melt was measured using the stable isotope ⁷³Ge as a tracer under a homogeneous static magnetic field in order to evaluate the influence of thermal convection upon isotope distribution. The results obtained showed that the magnetohydrodynamic effect in the melt obviously damped the convection, but it was not strong enough for the self-diffusion measurement.

Original language	English
Pages (from-to)	5274-5276
Number of pages	3
Journal	Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume	45
Issue number	6 A
DOIs	https://doi.org/10.1143/JJAP.45.5274
Publication status	Published - 2006 Jun 28

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Keywords

Convection
Germanium
Isotope
Self-diffusion coefficient
Static magnetic field
Time-of-flight secondary mass spectrometry

ASJC Scopus subject areas

Engineering(all)
Physics and Astronomy(all)

Cite this

Onishi, F., Inatomi, Y., Tanaka, T., Shinozaki, N., Watanabe, M., Fujimoto, A., & Itoh, K. (2006). Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, 45(6 A), 5274-5276. https://doi.org/10.1143/JJAP.45.5274

Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. / Onishi, Fumitomo; Inatomi, Yuko; Tanaka, Tomohiro; Shinozaki, Naoto; Watanabe, Masahito; Fujimoto, Akira; Itoh, Kouhei.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 45, No. 6 A, 28.06.2006, p. 5274-5276.

Research output: Contribution to journal › Article

Onishi, F, Inatomi, Y, Tanaka, T, Shinozaki, N, Watanabe, M, Fujimoto, A & Itoh, K 2006, 'Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient', Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, vol. 45, no. 6 A, pp. 5274-5276. https://doi.org/10.1143/JJAP.45.5274

Onishi, Fumitomo ; Inatomi, Yuko ; Tanaka, Tomohiro ; Shinozaki, Naoto ; Watanabe, Masahito ; Fujimoto, Akira ; Itoh, Kouhei. / Time-of-flight secondary mass spectrometry analysis of isotope composition for measurement of self-diffusion coefficient. In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers. 2006 ; Vol. 45, No. 6 A. pp. 5274-5276.

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Access to Document

10.1143/JJAP.45.5274