Time-resolved emission from self-assembled single quantum dots using scanning near-field optical microscope

Madoka Ono, Kazunari Matsuda, Toshiharu Saiki, Kenichi Nishi, Takashi Mukaiyama, Makoto Kuwata-Gonokami

Research output: Contribution to journalArticle

16 Citations (Scopus)

Abstract

We study time-resolved emission from self-assembled single InGaAs/GaAs quantum dots by the time-correlated single photon counting method using near-field optical microscopy. The decay time of the emission from discrete levels of a single quantum dot increases with the decrease in the emission energy and with the increase in the excitation intensity. We develop a rate equation model which accounts for the initial filling of the states, cascade relaxation, state filling and carrier feeding from a wetting layer. High collection efficiency of a double-tapered-type fiber probe enables us to study the emission even at very weak excitation intensities. The direct excitation into a single dot is dominant at this excitation level. State filling, cascade relaxation and extra carrier feeding from the wetting layer become pronounced when the excitation intensity increases.

Original languageEnglish
JournalJapanese Journal of Applied Physics, Part 2: Letters
Volume38
Issue number12 A
Publication statusPublished - 1999
Externally publishedYes

Fingerprint

optical microscopes
Semiconductor quantum dots
near fields
Microscopes
quantum dots
Scanning
scanning
Wetting
excitation
Time and motion study
wetting
cascades
Optical microscopy
Photons
Fibers
counting
microscopy
fibers
probes
photons

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Time-resolved emission from self-assembled single quantum dots using scanning near-field optical microscope. / Ono, Madoka; Matsuda, Kazunari; Saiki, Toshiharu; Nishi, Kenichi; Mukaiyama, Takashi; Kuwata-Gonokami, Makoto.

In: Japanese Journal of Applied Physics, Part 2: Letters, Vol. 38, No. 12 A, 1999.

Research output: Contribution to journalArticle

Ono, Madoka ; Matsuda, Kazunari ; Saiki, Toshiharu ; Nishi, Kenichi ; Mukaiyama, Takashi ; Kuwata-Gonokami, Makoto. / Time-resolved emission from self-assembled single quantum dots using scanning near-field optical microscope. In: Japanese Journal of Applied Physics, Part 2: Letters. 1999 ; Vol. 38, No. 12 A.
@article{41086724ab034f7599d0b83b4e449dbf,
title = "Time-resolved emission from self-assembled single quantum dots using scanning near-field optical microscope",
abstract = "We study time-resolved emission from self-assembled single InGaAs/GaAs quantum dots by the time-correlated single photon counting method using near-field optical microscopy. The decay time of the emission from discrete levels of a single quantum dot increases with the decrease in the emission energy and with the increase in the excitation intensity. We develop a rate equation model which accounts for the initial filling of the states, cascade relaxation, state filling and carrier feeding from a wetting layer. High collection efficiency of a double-tapered-type fiber probe enables us to study the emission even at very weak excitation intensities. The direct excitation into a single dot is dominant at this excitation level. State filling, cascade relaxation and extra carrier feeding from the wetting layer become pronounced when the excitation intensity increases.",
author = "Madoka Ono and Kazunari Matsuda and Toshiharu Saiki and Kenichi Nishi and Takashi Mukaiyama and Makoto Kuwata-Gonokami",
year = "1999",
language = "English",
volume = "38",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Japan Society of Applied Physics",
number = "12 A",

}

TY - JOUR

T1 - Time-resolved emission from self-assembled single quantum dots using scanning near-field optical microscope

AU - Ono, Madoka

AU - Matsuda, Kazunari

AU - Saiki, Toshiharu

AU - Nishi, Kenichi

AU - Mukaiyama, Takashi

AU - Kuwata-Gonokami, Makoto

PY - 1999

Y1 - 1999

N2 - We study time-resolved emission from self-assembled single InGaAs/GaAs quantum dots by the time-correlated single photon counting method using near-field optical microscopy. The decay time of the emission from discrete levels of a single quantum dot increases with the decrease in the emission energy and with the increase in the excitation intensity. We develop a rate equation model which accounts for the initial filling of the states, cascade relaxation, state filling and carrier feeding from a wetting layer. High collection efficiency of a double-tapered-type fiber probe enables us to study the emission even at very weak excitation intensities. The direct excitation into a single dot is dominant at this excitation level. State filling, cascade relaxation and extra carrier feeding from the wetting layer become pronounced when the excitation intensity increases.

AB - We study time-resolved emission from self-assembled single InGaAs/GaAs quantum dots by the time-correlated single photon counting method using near-field optical microscopy. The decay time of the emission from discrete levels of a single quantum dot increases with the decrease in the emission energy and with the increase in the excitation intensity. We develop a rate equation model which accounts for the initial filling of the states, cascade relaxation, state filling and carrier feeding from a wetting layer. High collection efficiency of a double-tapered-type fiber probe enables us to study the emission even at very weak excitation intensities. The direct excitation into a single dot is dominant at this excitation level. State filling, cascade relaxation and extra carrier feeding from the wetting layer become pronounced when the excitation intensity increases.

UR - http://www.scopus.com/inward/record.url?scp=0033343279&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0033343279&partnerID=8YFLogxK

M3 - Article

VL - 38

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 12 A

ER -