Transparent and luminescent thin films of partially substituted La10 (Si O4) 6 O3: Eu3+ apatite-type silicates

Yuichi Otsuka, Shinobu Fujihara

Research output: Contribution to journalArticle

7 Citations (Scopus)

Abstract

Partially substituted oxyapatite silicates, La8 M2 (Si O4) 6 O3: Eu3+ (M=Na, K, Mg, Ca, Sr, Y, and Gd), were prepared as powders and thin films by the conventional solid-state reaction and the sol-gel method, respectively. X-ray diffractometry and Fourier transform infrared spectroscopy were used to evaluate crystallinity and structure of the silicates. Transparent thin-film samples fabricated on quartz glass substrates exhibited intense red emissions due to Eu3+ upon irradiation with UV light through the charge-transfer excitation from O2- to Eu3+. The excitation wavelength, which was 268 nm for the nonsubstituted silicate, was shifted by the substitution in the host silicates. This shift was explained by the change in the lattice constant c and accordingly, the Eu-O distance. Our results then demonstrate that fine tuning of the excitation was possible in the chemically stable and transparent oxyapatite thin films.

Original languageEnglish
JournalJournal of the Electrochemical Society
Volume154
Issue number10
DOIs
Publication statusPublished - 2007

Fingerprint

Silicates
Apatites
Apatite
apatites
silicates
Thin films
thin films
excitation
Quartz
Solid state reactions
Ultraviolet radiation
Powders
X ray diffraction analysis
Sol-gel process
Lattice constants
Fourier transform infrared spectroscopy
Charge transfer
crystallinity
Substitution reactions
quartz

ASJC Scopus subject areas

  • Electrochemistry
  • Surfaces, Coatings and Films
  • Surfaces and Interfaces

Cite this

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abstract = "Partially substituted oxyapatite silicates, La8 M2 (Si O4) 6 O3: Eu3+ (M=Na, K, Mg, Ca, Sr, Y, and Gd), were prepared as powders and thin films by the conventional solid-state reaction and the sol-gel method, respectively. X-ray diffractometry and Fourier transform infrared spectroscopy were used to evaluate crystallinity and structure of the silicates. Transparent thin-film samples fabricated on quartz glass substrates exhibited intense red emissions due to Eu3+ upon irradiation with UV light through the charge-transfer excitation from O2- to Eu3+. The excitation wavelength, which was 268 nm for the nonsubstituted silicate, was shifted by the substitution in the host silicates. This shift was explained by the change in the lattice constant c and accordingly, the Eu-O distance. Our results then demonstrate that fine tuning of the excitation was possible in the chemically stable and transparent oxyapatite thin films.",
author = "Yuichi Otsuka and Shinobu Fujihara",
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T1 - Transparent and luminescent thin films of partially substituted La10 (Si O4) 6 O3

T2 - Eu3+ apatite-type silicates

AU - Otsuka, Yuichi

AU - Fujihara, Shinobu

PY - 2007

Y1 - 2007

N2 - Partially substituted oxyapatite silicates, La8 M2 (Si O4) 6 O3: Eu3+ (M=Na, K, Mg, Ca, Sr, Y, and Gd), were prepared as powders and thin films by the conventional solid-state reaction and the sol-gel method, respectively. X-ray diffractometry and Fourier transform infrared spectroscopy were used to evaluate crystallinity and structure of the silicates. Transparent thin-film samples fabricated on quartz glass substrates exhibited intense red emissions due to Eu3+ upon irradiation with UV light through the charge-transfer excitation from O2- to Eu3+. The excitation wavelength, which was 268 nm for the nonsubstituted silicate, was shifted by the substitution in the host silicates. This shift was explained by the change in the lattice constant c and accordingly, the Eu-O distance. Our results then demonstrate that fine tuning of the excitation was possible in the chemically stable and transparent oxyapatite thin films.

AB - Partially substituted oxyapatite silicates, La8 M2 (Si O4) 6 O3: Eu3+ (M=Na, K, Mg, Ca, Sr, Y, and Gd), were prepared as powders and thin films by the conventional solid-state reaction and the sol-gel method, respectively. X-ray diffractometry and Fourier transform infrared spectroscopy were used to evaluate crystallinity and structure of the silicates. Transparent thin-film samples fabricated on quartz glass substrates exhibited intense red emissions due to Eu3+ upon irradiation with UV light through the charge-transfer excitation from O2- to Eu3+. The excitation wavelength, which was 268 nm for the nonsubstituted silicate, was shifted by the substitution in the host silicates. This shift was explained by the change in the lattice constant c and accordingly, the Eu-O distance. Our results then demonstrate that fine tuning of the excitation was possible in the chemically stable and transparent oxyapatite thin films.

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