Transport coefficients for electrons in argon in crossed electric and magnetic rf fields

Z. M. Raspopović, S. Dujko, T. Makabe, Z. Lj Petrović

Research output: Contribution to journalArticle

14 Citations (Scopus)

Abstract

Monte Carlo simulations of electron transport have been performed in crossed electric and magnetic rf fields in argon. It was found that a magnetic field strongly affects electron transport, producing complex behaviour of the transport coefficients that cannot be predicted on the basis of dc field theory. In particular, it is important that a magnetic field, if it has sufficiently high amplitude, allows energy gain from the electric field only over a brief period of time, which leads to a pulse of directed motion and consequently to cyclotron oscillations being imprinted on the transport coefficients. Furthermore, this may lead to negative diffusion. The behaviour of drift velocities is also interesting, with a linear (sawtooth) dependence for the perpendicular drift velocity and bursts of drift for the longitudinal. Non-conservative effects are, on the other hand, reduced by the increasing magnetic field.

Original languageEnglish
Pages (from-to)293-300
Number of pages8
JournalPlasma Sources Science and Technology
Volume14
Issue number2
DOIs
Publication statusPublished - 2005 May 1

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transport properties
argon
magnetic fields
electrons
cyclotrons
bursts
oscillations
electric fields
pulses
simulation
energy

ASJC Scopus subject areas

  • Physics and Astronomy(all)
  • Condensed Matter Physics

Cite this

Transport coefficients for electrons in argon in crossed electric and magnetic rf fields. / Raspopović, Z. M.; Dujko, S.; Makabe, T.; Petrović, Z. Lj.

In: Plasma Sources Science and Technology, Vol. 14, No. 2, 01.05.2005, p. 293-300.

Research output: Contribution to journalArticle

Raspopović, Z. M. ; Dujko, S. ; Makabe, T. ; Petrović, Z. Lj. / Transport coefficients for electrons in argon in crossed electric and magnetic rf fields. In: Plasma Sources Science and Technology. 2005 ; Vol. 14, No. 2. pp. 293-300.
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