Two-dimensional analysis of liquid crystal orientation at in-plane switching substrate surface using a near-field scanning optical microscope

Toshiyasu Tadokoro, Toshiharu Saiki, Hirokazu Toriumi

Research output: Contribution to journalLetter

9 Citations (Scopus)


The microscopic liquid crystal (LC) orientation distribution in an in-plane switching (IPS) LC display device has been studied using a near-field scanning optical microscope (NSOM). The new NSOM system, which features an improved metal-coated optical fiber probe and is specifically designed for LC orientation analysis, has enabled successful visualization of the two-dimensional LC orientation distribution at the substrate surface. The observed NSOM images can be reproduced by theoretical simulations. These images together with the simulations reveal that the uneven-level structure of the interdigitated electrodes causes the asymmetric local LC orientation distribution near the electrode edges.

Original languageEnglish
Pages (from-to)L57-L59
JournalJapanese Journal of Applied Physics, Part 2: Letters
Issue number1 A/B
Publication statusPublished - 2003 Jan 15



  • Anchoring
  • Imaging
  • In-plane switching
  • Liquid crystal
  • Near-field scanning optical microscope (NSOM)
  • Surface orientation

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy (miscellaneous)
  • Physics and Astronomy(all)

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