TY - GEN
T1 - Two methods for estimating product lifetimes from only warranty claims data
AU - Suzuki, Kazuyuki
AU - Alam, Md Mesbahul
AU - Yoshikawa, Takuji
AU - Yamamoto, Wataru
PY - 2008
Y1 - 2008
N2 - Knowledge about product lifetime derived from real usage (field) data is of great interest in reliability analysis. A preferred source of such knowledge is warranty data, which are generated and updated at no additional cost from customer claims during warranty coverage. However, warranty databases contain only failure-related data, non-failure data is not included. This makes analysis difficult. The present research proposes two alternative methods for estimating product lifetimes from warranty claims data only. Two alternative methods, maximum likelihood and semiparametric, are described for estimating product lifetimes from warranty claims data only. They consider two lifetime variables: exponential failure, which corresponds to random failure mode, and Weibull failure, which corresponds to wear-out failure mode. They use only usage-at-failure data including exponential failure data. Simulation demons frated their applicability.
AB - Knowledge about product lifetime derived from real usage (field) data is of great interest in reliability analysis. A preferred source of such knowledge is warranty data, which are generated and updated at no additional cost from customer claims during warranty coverage. However, warranty databases contain only failure-related data, non-failure data is not included. This makes analysis difficult. The present research proposes two alternative methods for estimating product lifetimes from warranty claims data only. Two alternative methods, maximum likelihood and semiparametric, are described for estimating product lifetimes from warranty claims data only. They consider two lifetime variables: exponential failure, which corresponds to random failure mode, and Weibull failure, which corresponds to wear-out failure mode. They use only usage-at-failure data including exponential failure data. Simulation demons frated their applicability.
KW - Censoring distribution
KW - Random failure
KW - Reliability
KW - Usage time disfribution
KW - Wear-out failure
UR - http://www.scopus.com/inward/record.url?scp=51749113554&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=51749113554&partnerID=8YFLogxK
U2 - 10.1109/SSIRI.2008.59
DO - 10.1109/SSIRI.2008.59
M3 - Conference contribution
AN - SCOPUS:51749113554
SN - 9780769532660
T3 - Proceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
SP - 111
EP - 119
BT - Proceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
T2 - 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008
Y2 - 14 July 2008 through 17 July 2008
ER -