TY - GEN
T1 - Ultra-precision fluid jet and bonnet polishing for next generation hard X-ray telescope application
AU - Beaucamp, Anthony Th
AU - Matsumoto, Akihiro
AU - Namba, Yoshiharu
PY - 2010
Y1 - 2010
N2 - A study of automation of hard X-Ray molding dies polishing by FJP and BP was carried out. The following conclusions were drawn: 1. Surface roughness in the range 0.6-0.8nm rms can be obtained on electroless nickel samples by a combination of Fluid Jet polishing with micro-particles followed by Bonnet polishing with nano-particles. 2. Automated corrective polishing was demonstrated on a borosilicate cylindrical sample, with form error improvement from PV 3.2um down to 0.18um. 3. By using the automated process to get surface texture down to circa 0.6-0.8nm rms, it is possible to reduce the time of final hand polishing to 0.3nm by as much as 75% [3].
AB - A study of automation of hard X-Ray molding dies polishing by FJP and BP was carried out. The following conclusions were drawn: 1. Surface roughness in the range 0.6-0.8nm rms can be obtained on electroless nickel samples by a combination of Fluid Jet polishing with micro-particles followed by Bonnet polishing with nano-particles. 2. Automated corrective polishing was demonstrated on a borosilicate cylindrical sample, with form error improvement from PV 3.2um down to 0.18um. 3. By using the automated process to get surface texture down to circa 0.6-0.8nm rms, it is possible to reduce the time of final hand polishing to 0.3nm by as much as 75% [3].
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M3 - Conference contribution
AN - SCOPUS:84884405956
SN - 9781887706568
T3 - Proceedings - ASPE 2010 Annual Meeting
SP - 57
EP - 60
BT - Proceedings - ASPE 2010 Annual Meeting
T2 - 25th Annual Meeting of the American Society for Precision Engineering, ASPE 2010
Y2 - 31 October 2010 through 4 November 2010
ER -