Ultralow contact resistivity in annealed titanium edge contacts for multilayered graphene

Kazuyuki Ito, Takamasa Ogata, Tadashi Sakai, Yuji Awano

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Abstract

    The structure dependence and electrical properties of a metal contact with multilayered graphene (MLG) have been investigated. We demonstrate the superiority of end- (or edge-) contact configurations for future three-dimensional (3D) interconnect applications. The contact resistivity of titanium end contacts can be lowered to 7.7 × 10-8 Ω cm2 by thermal annealing at 450 ° C, which is 2 orders of magnitude lower than that of conventional top-contact configurations, and to the best of our knowledge, it is the lowest value ever reported for a pristine MLG. X-ray photoelectron spectroscopy (XPS) measurements revealed the formation of covalent-bonded titanium carbide as an interface layer between the metal layer and MLG.

    Original languageEnglish
    Number of pages1
    JournalApplied Physics Express
    Volume8
    Issue number2
    DOIs
    Publication statusPublished - 2015 Feb 1

    ASJC Scopus subject areas

    • Engineering(all)
    • Physics and Astronomy(all)

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