TY - JOUR
T1 - Ultraprecision Machining of Silicon Wafer by Micromilling Process
AU - Golshan, A.
AU - Baharudin, B. T.H.T.
AU - Aoyama, H.
AU - Ariffin, M. K.A.M.
AU - Ismail, M. I.S.
AU - Ehsan, A. A.
N1 - Publisher Copyright:
© 2017 The Authors. Published by Elsevier Ltd.
Copyright:
Copyright 2017 Elsevier B.V., All rights reserved.
PY - 2017
Y1 - 2017
N2 - Silicon, being a material which allows light transmission beyond visible spectrum is a good candidate for the integration of microfluidic and optical devices. The lack of rapid prototyping method in particular mechanical-based micromachining process for silicon device processing is due to the brittleness property of silicon. Silicon fails or breaks without significant deformation when subjected to tension or stress. This study presents an experimental investigation on surface of micro-machined single-crystal silicon with (111) orientation. Full immersion slot milling was conducted using solid cubic boron nitride (CBN) micro-end mills. Influences of cutting parameters including spindle speed, feed rate and axial depth of cut on surface roughness were analyzed. Surface and subsurface characterization studies show that the primary material removal mode is ductile or partial ductile using lower feed rate.
AB - Silicon, being a material which allows light transmission beyond visible spectrum is a good candidate for the integration of microfluidic and optical devices. The lack of rapid prototyping method in particular mechanical-based micromachining process for silicon device processing is due to the brittleness property of silicon. Silicon fails or breaks without significant deformation when subjected to tension or stress. This study presents an experimental investigation on surface of micro-machined single-crystal silicon with (111) orientation. Full immersion slot milling was conducted using solid cubic boron nitride (CBN) micro-end mills. Influences of cutting parameters including spindle speed, feed rate and axial depth of cut on surface roughness were analyzed. Surface and subsurface characterization studies show that the primary material removal mode is ductile or partial ductile using lower feed rate.
KW - Ductile-mode machining
KW - Micromilling
KW - Silicon wafer
KW - Surface integrity measurement
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U2 - 10.1016/j.proeng.2017.04.085
DO - 10.1016/j.proeng.2017.04.085
M3 - Conference article
AN - SCOPUS:85019748649
SN - 1877-7058
VL - 184
SP - 192
EP - 196
JO - Procedia Engineering
JF - Procedia Engineering
T2 - Advances in Material and Processing Technologies Conference, AMPT 2017
Y2 - 11 December 2017 through 14 December 2017
ER -