Unified understanding of Vth and Id variability in tri-gate nanowire MOSFETs

M. Saitoh, K. Ota, C. Tanaka, Y. Nakabayashi, K. Uchida, T. Numata

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    2 Citations (Scopus)


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    Engineering & Materials Science

    Chemical Compounds