Visualization of local perturbation in semiconductor quantum dots by near-field optical wavefunction mapping

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

We developed a new tool for investigating weak confinement potentials to detect local strain and disorder and for visualizing a local electric field due to an excess electron at a nearby confined state.

Original languageEnglish
Title of host publicationOptics InfoBase Conference Papers
Publication statusPublished - 2009
EventConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2009 - Shanghai, China
Duration: 2009 Aug 302009 Sep 3

Other

OtherConference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2009
CountryChina
CityShanghai
Period09/8/3009/9/3

Fingerprint

Wave functions
Semiconductor quantum dots
near fields
Visualization
quantum dots
Electric fields
disorders
perturbation
electric fields
Electrons
electrons

ASJC Scopus subject areas

  • Instrumentation
  • Atomic and Molecular Physics, and Optics

Cite this

Visualization of local perturbation in semiconductor quantum dots by near-field optical wavefunction mapping. / Saiki, Toshiharu.

Optics InfoBase Conference Papers. 2009.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Saiki, T 2009, Visualization of local perturbation in semiconductor quantum dots by near-field optical wavefunction mapping. in Optics InfoBase Conference Papers. Conference on Lasers and Electro-Optics/Pacific Rim, CLEOPR 2009, Shanghai, China, 09/8/30.
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