Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques

Teruhisa Horita, Mina Nishi, Taro Shimonosono, Haruo Kishimoto, Katsuhiko Yamaji, Manuel E. Brito, Harumi Yokokawa

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8 Citations (Scopus)

Abstract

The depth profiles of secondary ion mass spectrometry (SIMS) have been applied to analyze the distribution of 18O and metal oxide ions precisely at La0.6Sr0.4Co0.2Fe 0.8O3 - d/Gd0.1Ce0.9O 2 - x (GDC)/Y0.15Zr0.85O2 - y (YSZ) interfaces. 18O concentration peak was identified only under cathodic polarization with a constant current density of 0.071 A cm- 2 at 973 K under 18O2 atmosphere. The 18O peak position was corresponded to the Sr condensed zone where SrZrO3 was formed at the GDC/YSZ interfaces. The SrZrO3 formation and the 18O concentration profile pile-up are correlated to each other.

Original languageEnglish
Pages (from-to)398-402
Number of pages5
JournalSolid State Ionics
Volume262
DOIs
Publication statusPublished - 2014 Sep 1
Externally publishedYes

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Keywords

  • Cathode
  • Depth profiles
  • Isotope labeling
  • SIMS
  • SOFC

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Chemistry(all)

Cite this

Horita, T., Nishi, M., Shimonosono, T., Kishimoto, H., Yamaji, K., Brito, M. E., & Yokokawa, H. (2014). Visualization of oxide ionic diffusion at SOFC cathode/electrolyte interfaces by isotope labeling techniques. Solid State Ionics, 262, 398-402. https://doi.org/10.1016/j.ssi.2013.12.039