Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps

Yuji Yamagishi, Kei Kobayashi, Kei Noda, Hirofumi Yamada

    Research output: Contribution to journalArticle

    8 Citations (Scopus)

    Fingerprint Dive into the research topics of 'Visualization of trapped charges being ejected from organic thin-film transistor channels by Kelvin-probe force microscopy during gate voltage sweeps'. Together they form a unique fingerprint.

    Physics & Astronomy