Wireless DC voltage transmission using inductive-coupling channelfor highly-parallel wafer-level testing

Yoichi Yoshida, Koichi Nose, Yoshihiro Nakagawa, Koichiro Noguchi, Yasuhiro Morita, Masamoto Tago, Tadahiro Kuroda, Masayuki Mizuno

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    18 Citations (Scopus)
    Original languageEnglish
    Title of host publication2009 IEEE International Solid-State Circuits Conference - Digest of Technical Papers, ISSCC 2009
    PublisherInstitute of Electrical and Electronics Engineers Inc.
    Pages470-472
    Number of pages3
    ISBN (Print)1424434580, 9781424434589
    DOIs
    Publication statusPublished - 2009
    Event2009 IEEE International Solid-State Circuits Conference ISSCC 2009 - San Francisco, CA, United States
    Duration: 2009 Feb 82009 Feb 12

    Publication series

    NameDigest of Technical Papers - IEEE International Solid-State Circuits Conference
    ISSN (Print)0193-6530

    Other

    Other2009 IEEE International Solid-State Circuits Conference ISSCC 2009
    CountryUnited States
    CitySan Francisco, CA
    Period09/2/809/2/12

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Electrical and Electronic Engineering

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