X-ray diffraction

Research output: Chapter in Book/Report/Conference proceedingChapter

Abstract

X-ray diffraction is the basis for understanding X-ray diffraction imaging (XDI). In this chapter, the theoretical background of X-ray diffraction is introduced starting from Maxwell’s equation in the system of non-relativistic classical electromagnetism. First, fundamental equations are derived to describe electromagnetic waves emitted from accelerated electrons by solving Maxwell’s equation. The theory of dipole radiation is applied to electrons bound in atoms, and then the scattering cross section for Thomson scattering is derived. By applying this theory to a system composed of two or more electrons, the interference between the diffracted waves is described as the Fourier transform of the electron density in the system. The critical importance of the phases of the diffracted waves in structural analysis is demonstrated, and then, the experimental determination of phases in protein X-ray crystallography is briefly introduced.

Original languageEnglish
Title of host publicationSpringer Series in Optical Sciences
PublisherSpringer Verlag
Pages23-48
Number of pages26
DOIs
Publication statusPublished - 2018 Jan 1

Publication series

NameSpringer Series in Optical Sciences
Volume210
ISSN (Print)0342-4111
ISSN (Electronic)1556-1534

Fingerprint

Maxwell equations
X ray diffraction
Electrons
Scattering
Electromagnetism
X ray crystallography
Structural analysis
Electromagnetic waves
Carrier concentration
Fourier transforms
Proteins
Imaging techniques
Radiation
Atoms

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Nakasako, M. (2018). X-ray diffraction. In Springer Series in Optical Sciences (pp. 23-48). (Springer Series in Optical Sciences; Vol. 210). Springer Verlag. https://doi.org/10.1007/978-4-431-56618-2_2

X-ray diffraction. / Nakasako, Masayoshi.

Springer Series in Optical Sciences. Springer Verlag, 2018. p. 23-48 (Springer Series in Optical Sciences; Vol. 210).

Research output: Chapter in Book/Report/Conference proceedingChapter

Nakasako, M 2018, X-ray diffraction. in Springer Series in Optical Sciences. Springer Series in Optical Sciences, vol. 210, Springer Verlag, pp. 23-48. https://doi.org/10.1007/978-4-431-56618-2_2
Nakasako M. X-ray diffraction. In Springer Series in Optical Sciences. Springer Verlag. 2018. p. 23-48. (Springer Series in Optical Sciences). https://doi.org/10.1007/978-4-431-56618-2_2
Nakasako, Masayoshi. / X-ray diffraction. Springer Series in Optical Sciences. Springer Verlag, 2018. pp. 23-48 (Springer Series in Optical Sciences).
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