Zero-birefringence pressure sensitive adhesives for preventing the light leakage of LCDs

Hiroto Ito; Satoshi Yanai; Sumihisa Oda; Akihiro Tagaya; Yasuhiro Koike

Zero-birefringence pressure sensitive adhesives for preventing the light leakage of LCDs

Hiroto Ito, Satoshi Yanai, Sumihisa Oda, Akihiro Tagaya, Yasuhiro Koike

Department of Applied Physics and Physico-Informatics

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

To reduce the light leakage of liquid crystal displays (LCDs), pressure sensitive adhesives (PSAs) that exhibit no birefringence at any orientation were fabricated by the novel evaluation method of the birefringence of PSAs. This PSA successfully prevented the light leakage through the crossed polarizers after the accelerated aging test.

Original language	English
Title of host publication	Conference Program - MOC'11
Subtitle of host publication	17th Microoptics Conference
Publication status	Published - 2011 Dec 1
Event	17th Microoptics Conference, MOC'11 - Sendai, Japan Duration: 2011 Oct 30 → 2011 Nov 2

Publication series

Name	Conference Program - MOC'11: 17th Microoptics Conference

Other

Other	17th Microoptics Conference, MOC'11
Country	Japan
City	Sendai
Period	11/10/30 → 11/11/2

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Atomic and Molecular Physics, and Optics

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Zero-birefringence pressure sensitive adhesives for preventing the light leakage of LCDs. / Ito, Hiroto; Yanai, Satoshi; Oda, Sumihisa; Tagaya, Akihiro; Koike, Yasuhiro.

Conference Program - MOC'11: 17th Microoptics Conference. 2011. 6110351 (Conference Program - MOC'11: 17th Microoptics Conference).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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abstract = "To reduce the light leakage of liquid crystal displays (LCDs), pressure sensitive adhesives (PSAs) that exhibit no birefringence at any orientation were fabricated by the novel evaluation method of the birefringence of PSAs. This PSA successfully prevented the light leakage through the crossed polarizers after the accelerated aging test.",

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AU - Yanai, Satoshi

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AU - Koike, Yasuhiro

PY - 2011/12/1

Y1 - 2011/12/1

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